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X-RAY DIFFRACTION
Materials and Methods page
4ABR
  •   Crystallization Hide
    Crystallization Experiments
    Details 100 MM MES PH 6.5, 20 MM KCL, 8% (W/V) PEG20K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 202.17 α = 90
    b = 290.76 β = 97.63
    c = 250.65 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Collection Date 2011-08-27
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength 1.00
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.1
    Resolution(Low) 50
    Number Reflections(Observed) 503945
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.24
    Redundancy 8.1
     
    High Resolution Shell Details
    Resolution(High) 3.1
    Resolution(Low) 3.2
    Percent Possible(All) 92.6
    R Merge I(Observed) 0.7
    Mean I Over Sigma(Observed) 1.48
    Redundancy 2.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.1
    Resolution(Low) 50.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 503945
    Number of Reflections(R-Free) 24443
    Percent Reflections(Observed) 97.7
    R-Factor(Observed) 0.23
    R-Work 0.23
    R-Free 0.27
    R-Free Selection Details INHERITED FROM 2XQD
     
    Temperature Factor Modeling
    Mean Isotropic B Value 58.9
    Anisotropic B[1][1] -7.393
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -8.607
    Anisotropic B[2][2] -4.704
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 12.098
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1
    Shell Resolution(Low) 3.21
    Number of Reflections(R-Free) 1810
    Number of Reflections(R-Work) 43406
    R-Factor(R-Work) 0.331
    R-Factor(R-Free) 0.345
    Percent Reflections(Observed) 87.7
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_bond_d 0.007
    c_angle_deg 1.41
     
    Coordinate Error
    Luzzati ESD(Observed) 0.4
    Luzzati Sigma A(Observed) 0.6307
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.464
    Luzzati Sigma A(R-Free Set) 0.6403
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23270
    Nucleic Acid Atoms 37020
    Heterogen Atoms 90
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement CNS 1.2
     
    Software
    phasing PHASER
    data scaling XDS
    data reduction XDS
    refinement CNS version: 1.2
    model building PHASER