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X-RAY DIFFRACTION
Materials and Methods page
4AB4
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 67.01 α = 90
    b = 104.87 β = 90
    c = 106.43 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 210)
    Type ADSC
    Collection Date 2009-06-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength 0.93340
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 5.0
    Resolution(High) 1.5
    Resolution(Low) 21.4
    Number Reflections(Observed) 111101
    Percent Possible(Observed) 92.6
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 6.71
    Redundancy 7.0
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.58
    Percent Possible(All) 90.2
    R Merge I(Observed) 0.36
    Mean I Over Sigma(Observed) 5.0
    Redundancy 6.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.5
    Resolution(Low) 21.172
    Cut-off Sigma(F) 1.37
    Number of Reflections(Observed) 111027
    Number of Reflections(R-Free) 5557
    Percent Reflections(Observed) 92.27
    R-Factor(Observed) 0.1614
    R-Work 0.1602
    R-Free 0.1841
     
    Temperature Factor Modeling
    Mean Isotropic B Value 9.3
    Anisotropic B[1][1] -2.1822
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.9835
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.1987
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 1.517
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3338
    R-Factor(R-Work) 0.1924
    R-Factor(R-Free) 0.2248
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.517
    Shell Resolution(Low) 1.5349
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3363
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2332
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5349
    Shell Resolution(Low) 1.5536
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3378
    R-Factor(R-Work) 0.1718
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5536
    Shell Resolution(Low) 1.5733
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3380
    R-Factor(R-Work) 0.1781
    R-Factor(R-Free) 0.2067
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5733
    Shell Resolution(Low) 1.594
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3400
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.594
    Shell Resolution(Low) 1.6158
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3399
    R-Factor(R-Work) 0.1665
    R-Factor(R-Free) 0.2027
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6158
    Shell Resolution(Low) 1.6389
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3425
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6389
    Shell Resolution(Low) 1.6633
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3426
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.1721
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6633
    Shell Resolution(Low) 1.6893
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3439
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.1795
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6893
    Shell Resolution(Low) 1.717
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3453
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.717
    Shell Resolution(Low) 1.7466
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3474
    R-Factor(R-Work) 0.1512
    R-Factor(R-Free) 0.1738
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7466
    Shell Resolution(Low) 1.7783
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3436
    R-Factor(R-Work) 0.1434
    R-Factor(R-Free) 0.1676
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7783
    Shell Resolution(Low) 1.8125
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3457
    R-Factor(R-Work) 0.1473
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8125
    Shell Resolution(Low) 1.8495
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3440
    R-Factor(R-Work) 0.139
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8495
    Shell Resolution(Low) 1.8897
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3484
    R-Factor(R-Work) 0.1433
    R-Factor(R-Free) 0.1657
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8897
    Shell Resolution(Low) 1.9336
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3474
    R-Factor(R-Work) 0.1524
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9336
    Shell Resolution(Low) 1.9819
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3432
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1703
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9819
    Shell Resolution(Low) 2.0355
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3487
    R-Factor(R-Work) 0.147
    R-Factor(R-Free) 0.1756
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0355
    Shell Resolution(Low) 2.0953
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3450
    R-Factor(R-Work) 0.1537
    R-Factor(R-Free) 0.1848
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0953
    Shell Resolution(Low) 2.1629
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3459
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.1784
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1629
    Shell Resolution(Low) 2.2401
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3480
    R-Factor(R-Work) 0.1481
    R-Factor(R-Free) 0.1678
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2401
    Shell Resolution(Low) 2.3297
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3459
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.1764
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3297
    Shell Resolution(Low) 2.4356
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3453
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.1797
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4356
    Shell Resolution(Low) 2.5638
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3491
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.1752
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5638
    Shell Resolution(Low) 2.7241
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3613
    R-Factor(R-Work) 0.1643
    R-Factor(R-Free) 0.1597
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7241
    Shell Resolution(Low) 2.9339
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3715
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9339
    Shell Resolution(Low) 3.2282
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3812
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.2046
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2282
    Shell Resolution(Low) 3.6932
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3865
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.1729
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6932
    Shell Resolution(Low) 4.6449
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 3919
    R-Factor(R-Work) 0.1505
    R-Factor(R-Free) 0.1667
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6449
    Shell Resolution(Low) 21.1742
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4069
    R-Factor(R-Work) 0.21
    R-Factor(R-Free) 0.2367
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.083
    f_dihedral_angle_d 14.201
    f_angle_d 1.227
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5299
    Nucleic Acid Atoms 0
    Heterogen Atoms 131
    Solvent Atoms 824
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER