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ELECTRON MICROSCOPY
Materials and Methods page
4AAS
  •   EM Refinement Details Hide
    3D Reconstruction
    Reconstruction Method PROJECTION MATCHING
     
    EM Map-Model Fitting & Refinement
    Refinement Space REAL
    Refinement Protocol X-RAY
    Refinement Target CROSS-CORRELATION COEFFICIENT
    Fitting Procedure FLEXIBLE FITTING
     
    EM Image Reconstruction Statistics
    Number of Particles 5500
    Nominal Pixel Size 2.02
    Actual Pixel Size 2.02
    Effective Resolution 8.5
    CTF Correction Method EACH PARTICLE WAS PHASE FLIPPED
    Other Details SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMDB EMD -2000. (DEPOSITION ID: 10409).
     
    Electron Microscope Sample
    Sample Concentration (mg/ml) 4.0
    Sample pH 7.4
    Sample Support Details HOLEY CARBON
    Sample Vitrification Details VITRIFIED WITH A VITROBOT AT 100 PERCENT HUMIDITY WITH 2-3 SECONDS BLOTTING TIME
    Sample Aggregation State PARTICLE
    Name of Sample GROEL-ATP7 RS_OPEN
     
    Data Acquisition
    Temperature (Kelvin) 95.0
    Microscope Model FEI TECNAI F20
    Detector Type GATAN ULTRASCAN 4000 4K CCD CAMERA
    Minimum Defocus (NM) 700.0
    Maximum Defocus (NM) 3500.0
    Nominal CS 2.0
    Imaging Mode BRIGHT FIELD
    Electron Dose (electrons nm**-2) 15.0
    Illumination Mode LOW DOSE
    Calibrated Magnification 148500
    Source FIELD EMISSION GUN
    Acceleration Voltage (KV) 120
    Imaging Details THE DATA WAS COLLECTED WITH LEGINON AT SCRIPPS