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X-RAY DIFFRACTION
Materials and Methods page
4AA9
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.5
    Details RESERVOIR: 2 M (NH4)2SO4, 100 MM BIS-TRIS, PH 5.5. SAMPLE: 30 MG/ML PROTEIN IN 50 MM BIS-TRIS, PH 6.0.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 53.31 α = 90
    b = 66.11 β = 90
    c = 133.74 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MAR165)
    Type MARRESEARCH
    Details MULTILAYER MIRROR, CURVED TO FOCUS IN THE VERTICAL (R 400 M).
    Collection Date 2011-12-03
     
    Diffraction Radiation
    Monochromator BENT SI (111) CRYSTAL, HORIZONTALLY FOCUSING.
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-2
    Wavelength 1.04
    Site MAX II
    Beamline I911-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 15.0
    Resolution(High) 1.6
    Resolution(Low) 30
    Number Reflections(Observed) 62765
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 19.66
    Redundancy 8.6
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.7
    Percent Possible(All) 23.0
    R Merge I(Observed) 0.14
    Mean I Over Sigma(Observed) 6.0
    Redundancy 9.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6
    Resolution(Low) 24.795
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 62748
    Number of Reflections(R-Free) 3182
    Percent Reflections(Observed) 99.32
    R-Factor(Observed) 0.1874
    R-Work 0.1862
    R-Free 0.2084
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.5168
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.1275
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.6443
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6
    Shell Resolution(Low) 1.6239
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2411
    R-Factor(R-Work) 0.2932
    R-Factor(R-Free) 0.3237
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6239
    Shell Resolution(Low) 1.6493
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.272
    R-Factor(R-Free) 0.3355
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6493
    Shell Resolution(Low) 1.6763
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.2458
    R-Factor(R-Free) 0.2855
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6763
    Shell Resolution(Low) 1.7052
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.273
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7052
    Shell Resolution(Low) 1.7362
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2255
    R-Factor(R-Free) 0.2462
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7362
    Shell Resolution(Low) 1.7696
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.2106
    R-Factor(R-Free) 0.2583
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7696
    Shell Resolution(Low) 1.8057
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2562
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.2154
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8057
    Shell Resolution(Low) 1.8449
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2469
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8449
    Shell Resolution(Low) 1.8878
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2551
    R-Factor(R-Work) 0.1831
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8878
    Shell Resolution(Low) 1.935
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2562
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.2143
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.935
    Shell Resolution(Low) 1.9873
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.2134
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9873
    Shell Resolution(Low) 2.0458
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.1794
    R-Factor(R-Free) 0.2135
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0458
    Shell Resolution(Low) 2.1118
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.1914
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1118
    Shell Resolution(Low) 2.1872
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1737
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1872
    Shell Resolution(Low) 2.2747
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.1977
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2747
    Shell Resolution(Low) 2.3782
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.178
    R-Factor(R-Free) 0.2041
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3782
    Shell Resolution(Low) 2.5034
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.2081
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5034
    Shell Resolution(Low) 2.6601
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.1867
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6601
    Shell Resolution(Low) 2.8652
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.2501
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8652
    Shell Resolution(Low) 3.1531
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1955
    R-Factor(R-Free) 0.2209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1531
    Shell Resolution(Low) 3.6081
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.1927
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6081
    Shell Resolution(Low) 4.5413
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1536
    R-Factor(R-Free) 0.1651
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5413
    Shell Resolution(Low) 24.7983
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.208
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 11.984
    f_angle_d 1.061
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2438
    Nucleic Acid Atoms 0
    Heterogen Atoms 70
    Solvent Atoms 442
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX