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X-RAY DIFFRACTION
Materials and Methods page
4A9U
  •   Crystallization Hide
    Crystallization Experiments
    Details 0.1 M HEPES PH 7.5, 0.2 M MAGNESIUM NITRATE, 8-16% (W/V) PEG 3350
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.07 α = 90
    b = 91.07 β = 90
    c = 93.41 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2009-03-06
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I03
    Wavelength 0.9763
    Site DIAMOND
    Beamline I03
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.5
    Resolution(High) 2.7
    Resolution(Low) 60.26
    Number Reflections(Observed) 12692
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 49.13
    Redundancy 5.5
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.85
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.45
    Mean I Over Sigma(Observed) 3.7
    Redundancy 5.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.48
    Resolution(Low) 40.931
    Cut-off Sigma(F) 0.29
    Number of Reflections(Observed) 30202
    Number of Reflections(R-Free) 1548
    Percent Reflections(Observed) 98.28
    R-Factor(Observed) 0.1854
    R-Work 0.1839
    R-Free 0.2138
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.0915
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.0915
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.1829
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4801
    Shell Resolution(Low) 2.5602
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2551
    R-Factor(R-Work) 0.3098
    R-Factor(R-Free) 0.3411
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5602
    Shell Resolution(Low) 2.6517
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.2674
    R-Factor(R-Free) 0.2812
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6517
    Shell Resolution(Low) 2.7578
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.2348
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7578
    Shell Resolution(Low) 2.8833
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.2182
    R-Factor(R-Free) 0.2366
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8833
    Shell Resolution(Low) 3.0352
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.2086
    R-Factor(R-Free) 0.2384
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0352
    Shell Resolution(Low) 3.2253
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2134
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2253
    Shell Resolution(Low) 3.4743
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2574
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4743
    Shell Resolution(Low) 3.8237
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2247
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8237
    Shell Resolution(Low) 4.3764
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.1546
    R-Factor(R-Free) 0.1604
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3764
    Shell Resolution(Low) 5.5117
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.1569
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5117
    Shell Resolution(Low) 40.9363
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2152
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.043
    f_dihedral_angle_d 13.914
    f_angle_d 0.613
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2228
    Nucleic Acid Atoms 0
    Heterogen Atoms 67
    Solvent Atoms 88
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER