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X-RAY DIFFRACTION
Materials and Methods page
4A93
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 4-7% PEG 6000, 50 MM HEPES PH 7.0, 200 MM AMMONIUM ACETATE, 300MM SODIUM ACETATE, 5 MM TCEP, VAPOR DIFFUSION, HANGING DROP.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 221.64 α = 90
    b = 391.52 β = 90
    c = 281.77 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PSI PILATUS 6M)
    Type DECTRIS
    Collection Date 2008-02-08
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength 0.9188
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3.4
    Resolution(Low) 54
    Number Reflections(Observed) 167266
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.12
    B(Isotropic) From Wilson Plot 103.48
    Redundancy 7.0
     
    High Resolution Shell Details
    Resolution(High) 3.4
    Resolution(Low) 3.58
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.79
    Mean I Over Sigma(Observed) 2.3
    Redundancy 6.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.4
    Resolution(Low) 54.093
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 167169
    Number of Reflections(R-Free) 3298
    Percent Reflections(Observed) 99.96
    R-Factor(Observed) 0.1656
    R-Work 0.1649
    R-Free 0.1989
     
    Temperature Factor Modeling
    Mean Isotropic B Value 117.4
    Anisotropic B[1][1] -6.1881
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -21.0263
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 27.2144
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4
    Shell Resolution(Low) 3.4486
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 6808
    R-Factor(R-Work) 0.2987
    R-Factor(R-Free) 0.3173
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4486
    Shell Resolution(Low) 3.5
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6746
    R-Factor(R-Work) 0.2577
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5
    Shell Resolution(Low) 3.5547
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6764
    R-Factor(R-Work) 0.2455
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5547
    Shell Resolution(Low) 3.613
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6783
    R-Factor(R-Work) 0.2404
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.613
    Shell Resolution(Low) 3.6753
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 6799
    R-Factor(R-Work) 0.2333
    R-Factor(R-Free) 0.2427
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6753
    Shell Resolution(Low) 3.7421
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 6756
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.2602
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7421
    Shell Resolution(Low) 3.814
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 6817
    R-Factor(R-Work) 0.2097
    R-Factor(R-Free) 0.2564
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.814
    Shell Resolution(Low) 3.8919
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 6814
    R-Factor(R-Work) 0.1977
    R-Factor(R-Free) 0.2227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8919
    Shell Resolution(Low) 3.9765
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 6762
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2409
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9765
    Shell Resolution(Low) 4.0689
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 6777
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0689
    Shell Resolution(Low) 4.1707
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 6830
    R-Factor(R-Work) 0.1661
    R-Factor(R-Free) 0.2254
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1707
    Shell Resolution(Low) 4.2834
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6768
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2834
    Shell Resolution(Low) 4.4094
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 6832
    R-Factor(R-Work) 0.1378
    R-Factor(R-Free) 0.1663
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4094
    Shell Resolution(Low) 4.5516
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6796
    R-Factor(R-Work) 0.1211
    R-Factor(R-Free) 0.165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5516
    Shell Resolution(Low) 4.7142
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 6779
    R-Factor(R-Work) 0.1149
    R-Factor(R-Free) 0.1537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7142
    Shell Resolution(Low) 4.9028
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 6800
    R-Factor(R-Work) 0.117
    R-Factor(R-Free) 0.1539
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9028
    Shell Resolution(Low) 5.1258
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6845
    R-Factor(R-Work) 0.1315
    R-Factor(R-Free) 0.192
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1258
    Shell Resolution(Low) 5.3958
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6799
    R-Factor(R-Work) 0.1532
    R-Factor(R-Free) 0.1836
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3958
    Shell Resolution(Low) 5.7335
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 6862
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7335
    Shell Resolution(Low) 6.1757
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 6884
    R-Factor(R-Work) 0.1667
    R-Factor(R-Free) 0.1999
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1757
    Shell Resolution(Low) 6.7961
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 6859
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.1815
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7961
    Shell Resolution(Low) 7.777
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6901
    R-Factor(R-Work) 0.145
    R-Factor(R-Free) 0.1883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.777
    Shell Resolution(Low) 9.7887
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 6958
    R-Factor(R-Work) 0.1295
    R-Factor(R-Free) 0.1666
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.7887
    Shell Resolution(Low) 54.0999
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 7132
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.1954
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.095
    f_dihedral_angle_d 19.765
    f_angle_d 1.498
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 31167
    Nucleic Acid Atoms 929
    Heterogen Atoms 9
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER