X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 65.71 α = 90
b = 65.71 β = 90
c = 101.19 γ = 90
Symmetry
Space Group P 41 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC -- 2011-04-19
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X12 -- EMBL/DESY, HAMBURG X12

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 25 99.4 0.06 -- -- 11.8 -- 21058 -- -3.0 34.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.85 95.6 1.27 -- 2.0 11.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.801 23.608 -- 2.0 -- 21057 1053 99.47 -- 0.179 0.1778 0.2031 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8011 1.8831 -- 125 2391 0.2696 0.3203 -- 97.0
X Ray Diffraction 1.8831 1.9823 -- 129 2448 0.2128 0.2536 -- 99.0
X Ray Diffraction 1.9823 2.1064 -- 129 2440 0.1865 0.2319 -- 100.0
X Ray Diffraction 2.1064 2.269 -- 131 2487 0.1713 0.2079 -- 100.0
X Ray Diffraction 2.269 2.4971 -- 130 2483 0.1635 0.1863 -- 100.0
X Ray Diffraction 2.4971 2.8579 -- 133 2517 0.1625 0.2143 -- 100.0
X Ray Diffraction 2.8579 3.5986 -- 133 2539 0.1706 0.2143 -- 100.0
X Ray Diffraction 3.5986 23.6104 -- 143 2699 0.1776 0.1735 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 6.7216
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 6.7216
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -13.4432
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.092
f_dihedral_angle_d 16.261
f_angle_d 1.368
f_bond_d 0.012
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1048
Nucleic Acid Atoms 0
Heterogen Atoms 56
Solvent Atoms 192

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
PHASER model building