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X-RAY DIFFRACTION
Materials and Methods page
4A8Z
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.71 α = 90
    b = 65.71 β = 90
    c = 101.19 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2011-04-19
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type EMBL/DESY, HAMBURG BEAMLINE X12
    Wavelength 1.0
    Site EMBL/DESY, HAMBURG
    Beamline X12
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.8
    Resolution(Low) 25
    Number Reflections(Observed) 21058
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 34.2
    Redundancy 11.8
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.85
    Percent Possible(All) 95.6
    R Merge I(Observed) 1.27
    Mean I Over Sigma(Observed) 2.0
    Redundancy 11.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.801
    Resolution(Low) 23.608
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 21057
    Number of Reflections(R-Free) 1053
    Percent Reflections(Observed) 99.47
    R-Factor(Observed) 0.179
    R-Work 0.1778
    R-Free 0.2031
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 6.7216
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.7216
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -13.4432
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8011
    Shell Resolution(Low) 1.8831
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2391
    R-Factor(R-Work) 0.2696
    R-Factor(R-Free) 0.3203
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8831
    Shell Resolution(Low) 1.9823
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2448
    R-Factor(R-Work) 0.2128
    R-Factor(R-Free) 0.2536
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9823
    Shell Resolution(Low) 2.1064
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2440
    R-Factor(R-Work) 0.1865
    R-Factor(R-Free) 0.2319
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1064
    Shell Resolution(Low) 2.269
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2487
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.2079
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.269
    Shell Resolution(Low) 2.4971
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2483
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.1863
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4971
    Shell Resolution(Low) 2.8579
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2517
    R-Factor(R-Work) 0.1625
    R-Factor(R-Free) 0.2143
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8579
    Shell Resolution(Low) 3.5986
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2539
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2143
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5986
    Shell Resolution(Low) 23.6104
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.1735
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.092
    f_dihedral_angle_d 16.261
    f_angle_d 1.368
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1048
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 192
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER