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X-RAY DIFFRACTION
Materials and Methods page
4A72
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.4
    Details 200 NL OF PROTEIN AT 12 MG/ML IN 1 MM CYCLOSERINE MIXED WITH 200 NL OF RESERVOIR CONSISTING OF 0.1 M HEPES PH 7.5, 150-300 MM NACL AND 22.5-27.5% PEG 4000
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.35 α = 105.27
    b = 62.12 β = 90.66
    c = 119.24 γ = 104.43
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details MULTILAYER MIRROR, VERTICALLY FOCUSING
    Collection Date 2011-06-06
     
    Diffraction Radiation
    Monochromator BENT SI (111) CRYSTAL, HORIZONTALLY FOCUSING
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-2
    Wavelength 1.0
    Site MAX II
    Beamline I911-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 30
    Number Reflections(Observed) 61839
    Percent Possible(Observed) 95.5
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 27.53
    Redundancy 2.3
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.45
    Percent Possible(All) 82.6
    R Merge I(Observed) 0.5
    Mean I Over Sigma(Observed) 2.1
    Redundancy 2.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 26.391
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 61746
    Number of Reflections(R-Free) 3139
    Percent Reflections(Observed) 96.39
    R-Factor(Observed) 0.1763
    R-Work 0.1729
    R-Free 0.2394
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.487
    Anisotropic B[1][2] 4.6434
    Anisotropic B[1][3] 2.0306
    Anisotropic B[2][2] -1.734
    Anisotropic B[2][3] -4.874
    Anisotropic B[3][3] -2.753
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.4375
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.3335
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4375
    Shell Resolution(Low) 2.4774
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.2381
    R-Factor(R-Free) 0.3097
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4774
    Shell Resolution(Low) 2.5201
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.2337
    R-Factor(R-Free) 0.3817
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5201
    Shell Resolution(Low) 2.5659
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.2364
    R-Factor(R-Free) 0.3795
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5659
    Shell Resolution(Low) 2.6152
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.2178
    R-Factor(R-Free) 0.346
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6152
    Shell Resolution(Low) 2.6685
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2204
    R-Factor(R-Free) 0.3231
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6685
    Shell Resolution(Low) 2.7265
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.2102
    R-Factor(R-Free) 0.3048
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7265
    Shell Resolution(Low) 2.7898
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.2876
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7898
    Shell Resolution(Low) 2.8595
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1964
    R-Factor(R-Free) 0.2859
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8595
    Shell Resolution(Low) 2.9368
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1875
    R-Factor(R-Free) 0.2769
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9368
    Shell Resolution(Low) 3.0231
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2538
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0231
    Shell Resolution(Low) 3.1205
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1793
    R-Factor(R-Free) 0.2591
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1205
    Shell Resolution(Low) 3.2318
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.2265
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2318
    Shell Resolution(Low) 3.361
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.2427
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.361
    Shell Resolution(Low) 3.5136
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2659
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5136
    Shell Resolution(Low) 3.6984
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6984
    Shell Resolution(Low) 3.9294
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.2016
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9294
    Shell Resolution(Low) 4.2317
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1393
    R-Factor(R-Free) 0.1955
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2317
    Shell Resolution(Low) 4.6554
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1289
    R-Factor(R-Free) 0.1772
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6554
    Shell Resolution(Low) 5.3242
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.1407
    R-Factor(R-Free) 0.1989
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3242
    Shell Resolution(Low) 6.6899
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.2056
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6899
    Shell Resolution(Low) 26.3927
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.1687
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.038
    f_dihedral_angle_d 12.732
    f_angle_d 0.639
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13841
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 528
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX.REFINE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX.REFINE