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X-RAY DIFFRACTION
Materials and Methods page
4A6R
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.4
    Details 0.2 M MGCL2, 0.1 M HEPES PH 7.5, 22% W/V POLYACRYLIC ACID 5100 SODIUM SALT
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.59 α = 108.03
    b = 61.87 β = 87.31
    c = 63.54 γ = 105.16
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (SX-165)
    Type MARRESEARCH
    Details MULTILAYER MIRROR, VERTICALLY FOCUSING
    Collection Date 2011-04-16
     
    Diffraction Radiation
    Monochromator BENT SI (111) CRYSTAL, HORIZONTALLY FOCUSING
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-2
    Wavelength 1.0397
    Site MAX II
    Beamline I911-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.35
    Resolution(Low) 30
    Number Reflections(Observed) 690977
    Percent Possible(Observed) 94.1
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 10.87
    Redundancy 4.0
     
    High Resolution Shell Details
    Resolution(High) 1.35
    Resolution(Low) 1.38
    Percent Possible(All) 89.4
    R Merge I(Observed) 0.8
    Mean I Over Sigma(Observed) 1.9
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.349
    Resolution(Low) 23.287
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 169719
    Number of Reflections(R-Free) 8516
    Percent Reflections(Observed) 94.17
    R-Factor(Observed) 0.135
    R-Work 0.1335
    R-Free 0.1627
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.9941
    Anisotropic B[1][2] 0.7765
    Anisotropic B[1][3] 0.2733
    Anisotropic B[2][2] 0.0858
    Anisotropic B[2][3] 0.4737
    Anisotropic B[3][3] 0.9082
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.349
    Shell Resolution(Low) 1.3643
    Number of Reflections(R-Free) 267
    Number of Reflections(R-Work) 4957
    R-Factor(R-Work) 0.2994
    R-Factor(R-Free) 0.3518
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3643
    Shell Resolution(Low) 1.3804
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 5269
    R-Factor(R-Work) 0.2212
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3804
    Shell Resolution(Low) 1.3972
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 5151
    R-Factor(R-Work) 0.2079
    R-Factor(R-Free) 0.2509
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3972
    Shell Resolution(Low) 1.4149
    Number of Reflections(R-Free) 278
    Number of Reflections(R-Work) 5279
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2684
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4149
    Shell Resolution(Low) 1.4335
    Number of Reflections(R-Free) 280
    Number of Reflections(R-Work) 5243
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4335
    Shell Resolution(Low) 1.4531
    Number of Reflections(R-Free) 285
    Number of Reflections(R-Work) 5246
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.2416
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4531
    Shell Resolution(Low) 1.4739
    Number of Reflections(R-Free) 264
    Number of Reflections(R-Work) 5375
    R-Factor(R-Work) 0.1654
    R-Factor(R-Free) 0.2118
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4739
    Shell Resolution(Low) 1.4959
    Number of Reflections(R-Free) 288
    Number of Reflections(R-Work) 5198
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.189
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4959
    Shell Resolution(Low) 1.5193
    Number of Reflections(R-Free) 261
    Number of Reflections(R-Work) 5315
    R-Factor(R-Work) 0.1433
    R-Factor(R-Free) 0.1956
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5193
    Shell Resolution(Low) 1.5442
    Number of Reflections(R-Free) 293
    Number of Reflections(R-Work) 5304
    R-Factor(R-Work) 0.1345
    R-Factor(R-Free) 0.1757
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5442
    Shell Resolution(Low) 1.5708
    Number of Reflections(R-Free) 287
    Number of Reflections(R-Work) 5276
    R-Factor(R-Work) 0.1278
    R-Factor(R-Free) 0.1719
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5708
    Shell Resolution(Low) 1.5993
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 5360
    R-Factor(R-Work) 0.1214
    R-Factor(R-Free) 0.1572
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5993
    Shell Resolution(Low) 1.6301
    Number of Reflections(R-Free) 287
    Number of Reflections(R-Work) 5356
    R-Factor(R-Work) 0.1132
    R-Factor(R-Free) 0.1563
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6301
    Shell Resolution(Low) 1.6633
    Number of Reflections(R-Free) 294
    Number of Reflections(R-Work) 5322
    R-Factor(R-Work) 0.1146
    R-Factor(R-Free) 0.1615
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6633
    Shell Resolution(Low) 1.6995
    Number of Reflections(R-Free) 302
    Number of Reflections(R-Work) 5345
    R-Factor(R-Work) 0.1143
    R-Factor(R-Free) 0.1725
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6995
    Shell Resolution(Low) 1.739
    Number of Reflections(R-Free) 310
    Number of Reflections(R-Work) 5339
    R-Factor(R-Work) 0.1146
    R-Factor(R-Free) 0.1632
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.739
    Shell Resolution(Low) 1.7825
    Number of Reflections(R-Free) 278
    Number of Reflections(R-Work) 5458
    R-Factor(R-Work) 0.1089
    R-Factor(R-Free) 0.1557
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7825
    Shell Resolution(Low) 1.8307
    Number of Reflections(R-Free) 271
    Number of Reflections(R-Work) 5401
    R-Factor(R-Work) 0.1043
    R-Factor(R-Free) 0.1422
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8307
    Shell Resolution(Low) 1.8845
    Number of Reflections(R-Free) 299
    Number of Reflections(R-Work) 5399
    R-Factor(R-Work) 0.1106
    R-Factor(R-Free) 0.1362
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8845
    Shell Resolution(Low) 1.9453
    Number of Reflections(R-Free) 285
    Number of Reflections(R-Work) 5436
    R-Factor(R-Work) 0.1125
    R-Factor(R-Free) 0.1489
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9453
    Shell Resolution(Low) 2.0148
    Number of Reflections(R-Free) 285
    Number of Reflections(R-Work) 5408
    R-Factor(R-Work) 0.1155
    R-Factor(R-Free) 0.1549
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0148
    Shell Resolution(Low) 2.0954
    Number of Reflections(R-Free) 282
    Number of Reflections(R-Work) 5477
    R-Factor(R-Work) 0.1155
    R-Factor(R-Free) 0.1598
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0954
    Shell Resolution(Low) 2.1907
    Number of Reflections(R-Free) 275
    Number of Reflections(R-Work) 5514
    R-Factor(R-Work) 0.114
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1907
    Shell Resolution(Low) 2.3061
    Number of Reflections(R-Free) 262
    Number of Reflections(R-Work) 5521
    R-Factor(R-Work) 0.1108
    R-Factor(R-Free) 0.143
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3061
    Shell Resolution(Low) 2.4505
    Number of Reflections(R-Free) 284
    Number of Reflections(R-Work) 5523
    R-Factor(R-Work) 0.1156
    R-Factor(R-Free) 0.1431
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4505
    Shell Resolution(Low) 2.6394
    Number of Reflections(R-Free) 291
    Number of Reflections(R-Work) 5512
    R-Factor(R-Work) 0.1223
    R-Factor(R-Free) 0.1376
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6394
    Shell Resolution(Low) 2.9046
    Number of Reflections(R-Free) 284
    Number of Reflections(R-Work) 5550
    R-Factor(R-Work) 0.1345
    R-Factor(R-Free) 0.1657
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9046
    Shell Resolution(Low) 3.3239
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 5590
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1659
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3239
    Shell Resolution(Low) 4.1838
    Number of Reflections(R-Free) 323
    Number of Reflections(R-Work) 5542
    R-Factor(R-Work) 0.1367
    R-Factor(R-Free) 0.15
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1838
    Shell Resolution(Low) 23.29
    Number of Reflections(R-Free) 307
    Number of Reflections(R-Work) 5537
    R-Factor(R-Work) 0.1487
    R-Factor(R-Free) 0.1427
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.071
    f_dihedral_angle_d 13.098
    f_angle_d 1.219
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6640
    Nucleic Acid Atoms 0
    Heterogen Atoms 40
    Solvent Atoms 842
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER