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X-RAY DIFFRACTION
Materials and Methods page
4A6P
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.8
    Details 60 MM NA2HPO4 PH 6.0; 15% PEG 1000
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.92 α = 90
    b = 40.19 β = 90
    c = 87.22 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2009-04-19
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 0.9795
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.5
    Resolution(Low) 43.61
    Number Reflections(Observed) 32321
    Percent Possible(Observed) 92.4
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 7.99
    Redundancy 4.8
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.58
    Percent Possible(All) 87.7
    R Merge I(Observed) 0.55
    Mean I Over Sigma(Observed) 3.6
    Redundancy 4.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.498
    Resolution(Low) 26.589
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 31691
    Number of Reflections(R-Free) 1623
    Percent Reflections(Observed) 90.06
    R-Factor(Observed) 0.1852
    R-Work 0.1836
    R-Free 0.2137
     
    Temperature Factor Modeling
    Mean Isotropic B Value 14.758
    Anisotropic B[1][1] 1.3025
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.248
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.5505
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4982
    Shell Resolution(Low) 1.5422
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2046
    R-Factor(R-Work) 0.3619
    R-Factor(R-Free) 0.3967
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5422
    Shell Resolution(Low) 1.592
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.2072
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.592
    Shell Resolution(Low) 1.6489
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.2259
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6489
    Shell Resolution(Low) 1.7149
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.1829
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7149
    Shell Resolution(Low) 1.7929
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7929
    Shell Resolution(Low) 1.8875
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.1971
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8875
    Shell Resolution(Low) 2.0057
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2174
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.2245
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0057
    Shell Resolution(Low) 2.1605
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2335
    R-Factor(R-Work) 0.1869
    R-Factor(R-Free) 0.2205
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1605
    Shell Resolution(Low) 2.3778
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2478
    R-Factor(R-Work) 0.17
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3778
    Shell Resolution(Low) 2.7215
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.1993
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7215
    Shell Resolution(Low) 3.4277
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.1582
    R-Factor(R-Free) 0.209
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4277
    Shell Resolution(Low) 26.5931
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2804
    R-Factor(R-Work) 0.1572
    R-Factor(R-Free) 0.1623
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 15.337
    f_angle_d 1.026
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1710
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 432
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE