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X-RAY DIFFRACTION
Materials and Methods page
4A5U
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 0.1M HEPES PH 7.5 2.5 M AMMONIUM FORMATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 135.2 α = 90
    b = 135.2 β = 90
    c = 41.9 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2009-12-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SOLEIL BEAMLINE PROXIMA 1
    Wavelength 0.8856
    Site SOLEIL
    Beamline PROXIMA 1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2
    Resolution(Low) 39.5
    Number Reflections(Observed) 29613
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 27.24
    Redundancy 3.72
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.05
    Percent Possible(All) 99.5
    R Merge I(Observed) 0.06
    Mean I Over Sigma(Observed) 2.2
    Redundancy 3.74
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MIRAS
    reflnsShellList 2.0
    Resolution(Low) 39.029
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 29610
    Number of Reflections(R-Free) 2275
    Percent Reflections(Observed) 99.04
    R-Factor(Observed) 0.1704
    R-Work 0.1678
    R-Free 0.2011
     
    Temperature Factor Modeling
    Mean Isotropic B Value 33.2
    Anisotropic B[1][1] 2.7292
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.7292
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.6959
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.0715
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.2224
    R-Factor(R-Free) 0.2769
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0715
    Shell Resolution(Low) 2.1544
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.2001
    R-Factor(R-Free) 0.2402
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1544
    Shell Resolution(Low) 2.2525
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2469
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2525
    Shell Resolution(Low) 2.3712
    Number of Reflections(R-Free) 241
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3712
    Shell Resolution(Low) 2.5197
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1636
    R-Factor(R-Free) 0.2222
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5197
    Shell Resolution(Low) 2.7142
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.2076
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7142
    Shell Resolution(Low) 2.9873
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 2748
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9873
    Shell Resolution(Low) 3.4194
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.1704
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4194
    Shell Resolution(Low) 4.3072
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.148
    R-Factor(R-Free) 0.177
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3072
    Shell Resolution(Low) 39.0363
    Number of Reflections(R-Free) 236
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.1773
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 13.509
    f_angle_d 1.05
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1797
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 194
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELXCD, AUTOSHARP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AUTOSHARP
    model building SHELXCD