X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7.5
Details 0.1M HEPES PH 7.5 2.5 M AMMONIUM FORMATE

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 135.2 α = 90
b = 135.2 β = 90
c = 41.9 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC -- 2009-12-16
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 -- SOLEIL PROXIMA 1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 39.5 99.0 0.06 -- -- 3.72 -- 29613 -- -3.0 27.24
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.05 99.5 0.06 -- 2.2 3.74 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIRAS 2.0 39.029 -- 2.0 -- 29610 2275 99.04 -- 0.1704 0.1678 0.2011 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.0715 -- 220 2719 0.2224 0.2769 -- 99.0
X Ray Diffraction 2.0715 2.1544 -- 223 2691 0.2001 0.2402 -- 99.0
X Ray Diffraction 2.1544 2.2525 -- 220 2720 0.189 0.2469 -- 99.0
X Ray Diffraction 2.2525 2.3712 -- 241 2720 0.1685 0.1979 -- 99.0
X Ray Diffraction 2.3712 2.5197 -- 222 2710 0.1636 0.2222 -- 99.0
X Ray Diffraction 2.5197 2.7142 -- 228 2747 0.1676 0.2076 -- 100.0
X Ray Diffraction 2.7142 2.9873 -- 234 2748 0.1754 0.206 -- 99.0
X Ray Diffraction 2.9873 3.4194 -- 223 2732 0.1704 0.2122 -- 99.0
X Ray Diffraction 3.4194 4.3072 -- 228 2746 0.148 0.177 -- 98.0
X Ray Diffraction 4.3072 39.0363 -- 236 2802 0.1609 0.1773 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 33.2
Anisotropic B[1][1] 2.7292
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.7292
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.6959
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.069
f_dihedral_angle_d 13.509
f_angle_d 1.05
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1797
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 194

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
SHELXCD, AUTOSHARP Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
AUTOSHARP model building
SHELXCD model building