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X-RAY DIFFRACTION
Materials and Methods page
4A23
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details pH 7
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.92 α = 90
    b = 111.83 β = 90
    c = 227 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details MIRRORS
    Collection Date 2008-02-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength 1.03790
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.4
    Resolution(Low) 19.64
    Number Reflections(Observed) 79324
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 48.24
    Redundancy 7.4
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.53
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.04
    Mean I Over Sigma(Observed) 7.5
    Redundancy 7.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method ISOMORPHOUS REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 28.809
    Cut-off Sigma(F) 1.39
    Number of Reflections(Observed) 78783
    Number of Reflections(R-Free) 1557
    Percent Reflections(Observed) 99.32
    R-Factor(Observed) 0.175
    R-Work 0.1743
    R-Free 0.2089
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.757
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.7098
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.4668
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.4774
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 6932
    R-Factor(R-Work) 0.2341
    R-Factor(R-Free) 0.3111
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4774
    Shell Resolution(Low) 2.5659
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6928
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.2207
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5659
    Shell Resolution(Low) 2.6686
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 6961
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.2553
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6686
    Shell Resolution(Low) 2.7899
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 6974
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7899
    Shell Resolution(Low) 2.9369
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6989
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.2625
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9369
    Shell Resolution(Low) 3.1207
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 7004
    R-Factor(R-Work) 0.1875
    R-Factor(R-Free) 0.2101
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1207
    Shell Resolution(Low) 3.3613
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6997
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.2074
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3613
    Shell Resolution(Low) 3.699
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 7057
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.1807
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.699
    Shell Resolution(Low) 4.2328
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 7073
    R-Factor(R-Work) 0.1365
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2328
    Shell Resolution(Low) 5.3273
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 7159
    R-Factor(R-Work) 0.1308
    R-Factor(R-Free) 0.1358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3273
    Shell Resolution(Low) 28.8114
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 7152
    R-Factor(R-Work) 0.1774
    R-Factor(R-Free) 0.2153
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.077
    f_dihedral_angle_d 17.609
    f_angle_d 1.135
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8333
    Nucleic Acid Atoms 0
    Heterogen Atoms 132
    Solvent Atoms 871
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution REFMAC
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building REFMAC