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X-RAY DIFFRACTION
Materials and Methods page
4A1Y
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 83.03 α = 90
    b = 83.03 β = 90
    c = 77.9 γ = 90
     
    Space Group
    Space Group Name:    P 43
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Collection Date 2010-12-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type EMBL/DESY, HAMBURG BEAMLINE X12
    Wavelength 1.03317
    Site EMBL/DESY, HAMBURG
    Beamline X12
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.2
    Resolution(Low) 20
    Number Reflections(Observed) 154219
    Percent Possible(Observed) 93.9
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 17.0
    Redundancy 5.1
     
    High Resolution Shell Details
    Resolution(High) 1.2
    Resolution(Low) 1.23
    Percent Possible(All) 63.2
    R Merge I(Observed) 0.66
    Mean I Over Sigma(Observed) 1.4
    Redundancy 2.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.2
    Resolution(Low) 20.0
    Number of Reflections(Observed) 152369
    Number of Reflections(R-Free) 1809
    Percent Reflections(Observed) 93.85
    R-Factor(Observed) 0.13145
    R-Work 0.13117
    R-Free 0.15382
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 12.485
    Anisotropic B[1][1] 8.15
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 8.15
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -16.29
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.201
    Shell Resolution(Low) 1.232
    Number of Reflections(R-Free) 84
    Number of Reflections(R-Work) 7450
    R-Factor(R-Work) 0.249
    R-Factor(R-Free) 0.278
    Percent Reflections(Observed) 62.47
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_rigid_bond_restr 1.56
    r_scangle_it 6.819
    r_scbond_it 4.986
    r_mcangle_it 3.283
    r_mcbond_other 0.567
    r_mcbond_it 2.202
    r_gen_planes_other 0.002
    r_gen_planes_refined 0.006
    r_chiral_restr 0.081
    r_dihedral_angle_4_deg 15.82
    r_dihedral_angle_3_deg 12.801
    r_dihedral_angle_2_deg 37.525
    r_dihedral_angle_1_deg 6.052
    r_angle_other_deg 0.799
    r_angle_refined_deg 1.371
    r_bond_other_d 0.001
    r_bond_refined_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4192
    Nucleic Acid Atoms 0
    Heterogen Atoms 75
    Solvent Atoms 957
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    model building PHASER