X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
pH 4.5
Details pH 4.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 120.13 α = 90
b = 63.61 β = 130.1
c = 84.47 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD (MX-225) MARRESEARCH -- 2010-12-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X12 -- EMBL/DESY, HAMBURG X12

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 20 88.0 0.08 -- -- 3.4 -- 22007 -- -3.0 33.29
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.26 49.2 0.62 -- 1.6 2.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.201 19.945 -- 1.99 -- 22001 1101 88.63 -- 0.1973 0.1943 0.2518 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2014 2.3015 -- 81 1537 0.2971 0.3522 -- 53.0
X Ray Diffraction 2.3015 2.4226 -- 111 2097 0.273 0.3374 -- 71.0
X Ray Diffraction 2.4226 2.5741 -- 144 2744 0.2441 0.3198 -- 94.0
X Ray Diffraction 2.5741 2.7724 -- 151 2877 0.2433 0.3071 -- 98.0
X Ray Diffraction 2.7724 3.0505 -- 152 2885 0.2353 0.3441 -- 98.0
X Ray Diffraction 3.0505 3.4899 -- 152 2892 0.2044 0.2579 -- 98.0
X Ray Diffraction 3.4899 4.3892 -- 154 2908 0.1607 0.2145 -- 98.0
X Ray Diffraction 4.3892 19.9463 -- 156 2960 0.153 0.1955 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -9.5794
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -3.4755
Anisotropic B[2][2] 15.4309
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.8515
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.002
f_chiral_restr 0.048
f_dihedral_angle_d 15.52
f_angle_d 0.766
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3135
Nucleic Acid Atoms 0
Heterogen Atoms 63
Solvent Atoms 205

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
PHASER model building