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X-RAY DIFFRACTION
Materials and Methods page
4A1H
  •   Crystallization Hide
    Crystallization Experiments
    pH 4.5
    Details pH 4.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 120.13 α = 90
    b = 63.61 β = 130.1
    c = 84.47 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Collection Date 2010-12-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type EMBL/DESY, HAMBURG BEAMLINE X12
    Wavelength 1.0332
    Site EMBL/DESY, HAMBURG
    Beamline X12
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.2
    Resolution(Low) 20
    Number Reflections(Observed) 22007
    Percent Possible(Observed) 88.0
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 33.29
    Redundancy 3.4
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.26
    Percent Possible(All) 49.2
    R Merge I(Observed) 0.62
    Mean I Over Sigma(Observed) 1.6
    Redundancy 2.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.201
    Resolution(Low) 19.945
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 22001
    Number of Reflections(R-Free) 1101
    Percent Reflections(Observed) 88.63
    R-Factor(Observed) 0.1973
    R-Work 0.1943
    R-Free 0.2518
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -9.5794
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.4755
    Anisotropic B[2][2] 15.4309
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.8515
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2014
    Shell Resolution(Low) 2.3015
    Number of Reflections(R-Free) 81
    Number of Reflections(R-Work) 1537
    R-Factor(R-Work) 0.2971
    R-Factor(R-Free) 0.3522
    Percent Reflections(Observed) 53.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3015
    Shell Resolution(Low) 2.4226
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2097
    R-Factor(R-Work) 0.273
    R-Factor(R-Free) 0.3374
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4226
    Shell Resolution(Low) 2.5741
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2744
    R-Factor(R-Work) 0.2441
    R-Factor(R-Free) 0.3198
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5741
    Shell Resolution(Low) 2.7724
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2877
    R-Factor(R-Work) 0.2433
    R-Factor(R-Free) 0.3071
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7724
    Shell Resolution(Low) 3.0505
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2885
    R-Factor(R-Work) 0.2353
    R-Factor(R-Free) 0.3441
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0505
    Shell Resolution(Low) 3.4899
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2892
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2579
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4899
    Shell Resolution(Low) 4.3892
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2908
    R-Factor(R-Work) 0.1607
    R-Factor(R-Free) 0.2145
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3892
    Shell Resolution(Low) 19.9463
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2960
    R-Factor(R-Work) 0.153
    R-Factor(R-Free) 0.1955
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.048
    f_dihedral_angle_d 15.52
    f_angle_d 0.766
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3135
    Nucleic Acid Atoms 0
    Heterogen Atoms 63
    Solvent Atoms 205
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER