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X-RAY DIFFRACTION
Materials and Methods page
4A07
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 1.2 M NA CITRATE 0.1 M HEPES PH 7.5 10 M DTT.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 148.21 α = 90
    b = 44.03 β = 101.23
    c = 47.67 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX
    Details MIRRORS
    Collection Date 2009-12-04
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength 0.9999
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.8
    Resolution(High) 1.85
    Resolution(Low) 47
    Number Reflections(Observed) 25852
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 16.59
    Redundancy 4.6
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.95
    Percent Possible(All) 98.9
    R Merge I(Observed) 0.72
    Mean I Over Sigma(Observed) 2.8
    Redundancy 4.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.85
    Resolution(Low) 36.242
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 25850
    Number of Reflections(R-Free) 1292
    Percent Reflections(Observed) 99.37
    R-Factor(Observed) 0.1609
    R-Work 0.1588
    R-Free 0.1997
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.5851
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.4489
    Anisotropic B[2][2] 0.2149
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.3702
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8499
    Shell Resolution(Low) 1.924
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.2261
    R-Factor(R-Free) 0.2768
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.924
    Shell Resolution(Low) 2.0115
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.216
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0115
    Shell Resolution(Low) 2.1176
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1565
    R-Factor(R-Free) 0.2333
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1176
    Shell Resolution(Low) 2.2502
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.1467
    R-Factor(R-Free) 0.1799
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2502
    Shell Resolution(Low) 2.4239
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1432
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4239
    Shell Resolution(Low) 2.6678
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6678
    Shell Resolution(Low) 3.0536
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0536
    Shell Resolution(Low) 3.8466
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.1534
    R-Factor(R-Free) 0.1776
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8466
    Shell Resolution(Low) 36.2486
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2840
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.1883
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 13.644
    f_angle_d 1.09
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2240
    Nucleic Acid Atoms 0
    Heterogen Atoms 85
    Solvent Atoms 209
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER