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X-RAY DIFFRACTION
Materials and Methods page
4A06
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 1.2 M NA CITRATE, 0.1 M HEPES PH 7.5, 10 MM DTT.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 148.39 α = 90
    b = 44.1 β = 100.07
    c = 47.3 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Details MIRRORS
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 1.000
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 5.6
    Resolution(High) 2
    Resolution(Low) 37
    Number Reflections(Observed) 19306
    Percent Possible(Observed) 94.0
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 21.72
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.1
    Percent Possible(All) 96.5
    R Merge I(Observed) 0.3
    Mean I Over Sigma(Observed) 5.6
    Redundancy 3.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 36.526
    Cut-off Sigma(F) 1.39
    Number of Reflections(Observed) 19306
    Number of Reflections(R-Free) 309
    Percent Reflections(Observed) 93.59
    R-Factor(Observed) 0.1611
    R-Work 0.1605
    R-Free 0.1977
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.1938
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.8616
    Anisotropic B[2][2] 1.9448
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.751
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.5197
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 9619
    R-Factor(R-Work) 0.1644
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5197
    Shell Resolution(Low) 36.5324
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 9378
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.1874
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 12.654
    f_angle_d 1.095
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2228
    Nucleic Acid Atoms 0
    Heterogen Atoms 62
    Solvent Atoms 106
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER