X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Details 1.7M SODIUM MALONATE, PH 7.5 AND 1 MM MGCL2

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 50.82 α = 90
b = 68.53 β = 112.35
c = 58.9 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD (MX-325) MARRESEARCH -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 -- SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 20.39 97.6 0.03 -- -- 3.0 -- 26462 -- 0.0 24.76
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.55 1.63 99.6 0.63 -- -- 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.55 20.39 -- 1.34 -- 26446 2002 97.48 -- 0.1889 0.1867 0.2157 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.55 1.5888 -- 133 1797 0.3177 0.3515 -- 100.0
X Ray Diffraction 1.5888 1.6317 -- 150 1775 0.2822 0.2974 -- 99.0
X Ray Diffraction 1.6317 1.6797 -- 149 1753 0.2549 0.2913 -- 99.0
X Ray Diffraction 1.6797 1.7339 -- 148 1780 0.2408 0.283 -- 100.0
X Ray Diffraction 1.7339 1.7958 -- 132 1774 0.2235 0.2737 -- 100.0
X Ray Diffraction 1.7958 1.8677 -- 162 1775 0.2274 0.2735 -- 100.0
X Ray Diffraction 1.8677 1.9526 -- 136 1797 0.2303 0.2484 -- 100.0
X Ray Diffraction 1.9526 2.0555 -- 149 1752 0.2194 0.2543 -- 100.0
X Ray Diffraction 2.0555 2.1841 -- 147 1774 0.2181 0.2458 -- 99.0
X Ray Diffraction 2.1841 2.3525 -- 146 1780 0.2107 0.2485 -- 99.0
X Ray Diffraction 2.3525 2.5888 -- 149 1751 0.2104 0.2446 -- 98.0
X Ray Diffraction 2.5888 2.9625 -- 146 1759 0.203 0.2173 -- 98.0
X Ray Diffraction 2.9625 3.7287 -- 143 1700 0.1436 0.1814 -- 95.0
X Ray Diffraction 3.7287 20.3919 -- 112 1477 0.1461 0.1605 -- 80.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.008
f_chiral_restr 0.041
f_dihedral_angle_d 14.414
f_angle_d 0.945
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 0
Nucleic Acid Atoms 1344
Heterogen Atoms 16
Solvent Atoms 289

Software

Computing
Computing Package Purpose
IMOSFLM Data Reduction (intensity integration)
PHENIX Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
PHENIX model building