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X-RAY DIFFRACTION
Materials and Methods page
3ZNU
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.24 α = 90
    b = 103.57 β = 90
    c = 141.67 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details MIRRORS
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.65
    Resolution(Low) 19.8
    Number Reflections(Observed) 138381
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 18.81
    Redundancy 5.7
     
    High Resolution Shell Details
    Resolution(High) 1.65
    Resolution(Low) 1.75
    Percent Possible(All) 98.6
    R Merge I(Observed) 0.51
    Mean I Over Sigma(Observed) 2.64
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.65
    Resolution(Low) 19.828
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 138378
    Number of Reflections(R-Free) 4155
    Percent Reflections(Observed) 99.88
    R-Factor(Observed) 0.1584
    R-Work 0.1573
    R-Free 0.1909
     
    Temperature Factor Modeling
    Mean Isotropic B Value 24.0
    Anisotropic B[1][1] 1.0965
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.1167
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.2132
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.65
    Shell Resolution(Low) 1.6687
    Number of Reflections(R-Free) 69
    Number of Reflections(R-Work) 4474
    R-Factor(R-Work) 0.2396
    R-Factor(R-Free) 0.2352
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6687
    Shell Resolution(Low) 1.6884
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 4311
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.279
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6884
    Shell Resolution(Low) 1.7089
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4574
    R-Factor(R-Work) 0.2245
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7089
    Shell Resolution(Low) 1.7306
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4321
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.2642
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7306
    Shell Resolution(Low) 1.7533
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4543
    R-Factor(R-Work) 0.2058
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7533
    Shell Resolution(Low) 1.7773
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4315
    R-Factor(R-Work) 0.1941
    R-Factor(R-Free) 0.2411
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7773
    Shell Resolution(Low) 1.8027
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4542
    R-Factor(R-Work) 0.1865
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8027
    Shell Resolution(Low) 1.8296
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4310
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8296
    Shell Resolution(Low) 1.8582
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4581
    R-Factor(R-Work) 0.1712
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8582
    Shell Resolution(Low) 1.8886
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4300
    R-Factor(R-Work) 0.1689
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8886
    Shell Resolution(Low) 1.9211
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4571
    R-Factor(R-Work) 0.1533
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9211
    Shell Resolution(Low) 1.956
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4323
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.956
    Shell Resolution(Low) 1.9936
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4602
    R-Factor(R-Work) 0.1536
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9936
    Shell Resolution(Low) 2.0343
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4260
    R-Factor(R-Work) 0.1467
    R-Factor(R-Free) 0.1894
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0343
    Shell Resolution(Low) 2.0785
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4598
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0785
    Shell Resolution(Low) 2.1268
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4333
    R-Factor(R-Work) 0.145
    R-Factor(R-Free) 0.1902
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1268
    Shell Resolution(Low) 2.1799
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4599
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1799
    Shell Resolution(Low) 2.2388
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4333
    R-Factor(R-Work) 0.141
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2388
    Shell Resolution(Low) 2.3045
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4622
    R-Factor(R-Work) 0.1485
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3045
    Shell Resolution(Low) 2.3788
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4305
    R-Factor(R-Work) 0.1441
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3788
    Shell Resolution(Low) 2.4637
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4616
    R-Factor(R-Work) 0.1397
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4637
    Shell Resolution(Low) 2.5621
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4331
    R-Factor(R-Work) 0.1389
    R-Factor(R-Free) 0.1793
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5621
    Shell Resolution(Low) 2.6785
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4624
    R-Factor(R-Work) 0.1481
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6785
    Shell Resolution(Low) 2.8193
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4375
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.1833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8193
    Shell Resolution(Low) 2.9954
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4645
    R-Factor(R-Work) 0.1562
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9954
    Shell Resolution(Low) 3.2257
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4371
    R-Factor(R-Work) 0.1614
    R-Factor(R-Free) 0.1891
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2257
    Shell Resolution(Low) 3.5487
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4679
    R-Factor(R-Work) 0.1501
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5487
    Shell Resolution(Low) 4.0584
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4410
    R-Factor(R-Work) 0.1474
    R-Factor(R-Free) 0.1822
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0584
    Shell Resolution(Low) 5.0987
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 4735
    R-Factor(R-Work) 0.1294
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0987
    Shell Resolution(Low) 19.8292
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 4620
    R-Factor(R-Work) 0.1974
    R-Factor(R-Free) 0.1761
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.084
    f_dihedral_angle_d 13.064
    f_angle_d 1.416
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7858
    Nucleic Acid Atoms 0
    Heterogen Atoms 101
    Solvent Atoms 1234
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP