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X-RAY DIFFRACTION
Materials and Methods page
3ZNJ
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 151.14 α = 90
    b = 79.43 β = 93.41
    c = 198.97 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details MIRRORS
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.3
    Resolution(High) 2.1
    Resolution(Low) 20
    Number Reflections(Observed) 261677
    Percent Possible(Observed) 95.3
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 25.74
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.21
    Percent Possible(All) 90.0
    R Merge I(Observed) 0.18
    Mean I Over Sigma(Observed) 6.7
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 19.898
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 261632
    Number of Reflections(R-Free) 1340
    Percent Reflections(Observed) 95.28
    R-Factor(Observed) 0.1644
    R-Work 0.1641
    R-Free 0.2235
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.175
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 24325
    R-Factor(R-Work) 0.1842
    R-Factor(R-Free) 0.2548
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.175
    Shell Resolution(Low) 2.2619
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 24629
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.2741
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2619
    Shell Resolution(Low) 2.3647
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 24901
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3647
    Shell Resolution(Low) 2.4892
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 25325
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.2125
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4892
    Shell Resolution(Low) 2.6448
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 25814
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.2412
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6448
    Shell Resolution(Low) 2.8485
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 26478
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2439
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8485
    Shell Resolution(Low) 3.1341
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 26830
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2705
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1341
    Shell Resolution(Low) 3.5853
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 27135
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5853
    Shell Resolution(Low) 4.5085
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 27225
    R-Factor(R-Work) 0.1449
    R-Factor(R-Free) 0.2039
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5085
    Shell Resolution(Low) 19.8986
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 27630
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.1568
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.048
    f_dihedral_angle_d 14.514
    f_angle_d 0.807
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 31551
    Nucleic Acid Atoms 0
    Heterogen Atoms 352
    Solvent Atoms 2755
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE: DEV_1172)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: DEV_1172)
    model building MOLREP