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X-RAY DIFFRACTION
Materials and Methods page
3ZLV
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details pH 7
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.57 α = 90
    b = 112.38 β = 90
    c = 226.99 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARREASERCH
    Collection Date 2009-06-26
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength 1.04123
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.5
    Resolution(Low) 29.21
    Number Reflections(Observed) 71276
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.09
    B(Isotropic) From Wilson Plot 48.97
    Redundancy 7.4
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.64
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.5
    Mean I Over Sigma(Observed) 4.9
    Redundancy 7.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 2.5
    Resolution(Low) 29.193
    Cut-off Sigma(F) 1.39
    Number of Reflections(Observed) 71157
    Number of Reflections(R-Free) 1426
    Percent Reflections(Observed) 99.94
    R-Factor(Observed) 0.177
    R-Work 0.1761
    R-Free 0.2255
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.0826
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.6685
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.4141
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5001
    Shell Resolution(Low) 2.5894
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 6870
    R-Factor(R-Work) 0.2631
    R-Factor(R-Free) 0.3334
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5894
    Shell Resolution(Low) 2.693
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 6870
    R-Factor(R-Work) 0.2381
    R-Factor(R-Free) 0.3293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.693
    Shell Resolution(Low) 2.8155
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6892
    R-Factor(R-Work) 0.2201
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8155
    Shell Resolution(Low) 2.9638
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6916
    R-Factor(R-Work) 0.2049
    R-Factor(R-Free) 0.2641
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9638
    Shell Resolution(Low) 3.1492
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 6905
    R-Factor(R-Work) 0.1941
    R-Factor(R-Free) 0.2738
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1492
    Shell Resolution(Low) 3.3921
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6945
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3921
    Shell Resolution(Low) 3.7328
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6967
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.2023
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7328
    Shell Resolution(Low) 4.2715
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6993
    R-Factor(R-Work) 0.1426
    R-Factor(R-Free) 0.1813
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2715
    Shell Resolution(Low) 5.3761
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 7076
    R-Factor(R-Work) 0.1355
    R-Factor(R-Free) 0.1856
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3761
    Shell Resolution(Low) 29.1953
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 7297
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.2202
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.02
    f_chiral_restr 0.068
    f_dihedral_angle_d 16.266
    f_angle_d 1.013
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8370
    Nucleic Acid Atoms 0
    Heterogen Atoms 86
    Solvent Atoms 676
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution REFAMC
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building REFAMC