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X-RAY DIFFRACTION
Materials and Methods page
3ZLU
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details pH 7
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.99 α = 90
    b = 113.52 β = 90
    c = 227.51 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Type CCDCHESS
    Collection Date 2010-06-03
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength 1.0
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.6
    Resolution(Low) 30.02
    Number Reflections(Observed) 64575
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 55.38
    Redundancy 6.7
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.72
    Percent Possible(All) 99.1
    R Merge I(Observed) 0.5
    Mean I Over Sigma(Observed) 5.0
    Redundancy 6.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 2.6
    Resolution(Low) 29.333
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 64481
    Number of Reflections(R-Free) 1283
    Percent Reflections(Observed) 99.91
    R-Factor(Observed) 0.1763
    R-Work 0.1755
    R-Free 0.2171
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.0009
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.1511
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.152
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.704
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 6931
    R-Factor(R-Work) 0.251
    R-Factor(R-Free) 0.2879
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.704
    Shell Resolution(Low) 2.827
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6937
    R-Factor(R-Work) 0.262
    R-Factor(R-Free) 0.3354
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.827
    Shell Resolution(Low) 2.9759
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6951
    R-Factor(R-Work) 0.2419
    R-Factor(R-Free) 0.3352
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9759
    Shell Resolution(Low) 3.1622
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 6941
    R-Factor(R-Work) 0.2165
    R-Factor(R-Free) 0.2811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1622
    Shell Resolution(Low) 3.406
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6958
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.406
    Shell Resolution(Low) 3.7481
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 7018
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7481
    Shell Resolution(Low) 4.289
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 7035
    R-Factor(R-Work) 0.153
    R-Factor(R-Free) 0.2008
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.289
    Shell Resolution(Low) 5.3982
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 7111
    R-Factor(R-Work) 0.133
    R-Factor(R-Free) 0.1647
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3982
    Shell Resolution(Low) 29.3348
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 7316
    R-Factor(R-Work) 0.1589
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.082
    f_dihedral_angle_d 17.463
    f_angle_d 1.139
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8356
    Nucleic Acid Atoms 0
    Heterogen Atoms 55
    Solvent Atoms 454
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution REFMAC
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building REFMAC