X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
pH 7
Details pH 7

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 80.01 α = 90
b = 113.17 β = 90
c = 226.35 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2010-06-03
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-3 -- MAX II I911-3

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 29.22 99.9 0.09 -- -- 7.4 -- 63495 -- 3.0 48.97
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.72 100.0 0.44 -- 3.5 7.4 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
OTHER 2.6 29.22 -- 1.35 -- 63450 1260 99.09 -- 0.1712 0.1704 0.2152 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.704 -- 140 6802 0.2445 0.2882 -- 99.0
X Ray Diffraction 2.704 2.827 -- 144 6801 0.2385 0.3128 -- 99.0
X Ray Diffraction 2.827 2.9759 -- 135 6844 0.2171 0.2919 -- 99.0
X Ray Diffraction 2.9759 3.1622 -- 147 6826 0.1961 0.2265 -- 99.0
X Ray Diffraction 3.1622 3.406 -- 132 6854 0.1861 0.217 -- 99.0
X Ray Diffraction 3.406 3.7481 -- 140 6902 0.1702 0.2242 -- 99.0
X Ray Diffraction 3.7481 4.289 -- 140 6931 0.1423 0.1868 -- 99.0
X Ray Diffraction 4.289 5.3981 -- 136 6998 0.1311 0.1643 -- 99.0
X Ray Diffraction 5.3981 29.2216 -- 146 7232 0.1664 0.2081 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 1.5365
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.391
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.9275
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.079
f_dihedral_angle_d 15.995
f_angle_d 1.169
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8363
Nucleic Acid Atoms 0
Heterogen Atoms 69
Solvent Atoms 613

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
REFMAC Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
REFMAC model building