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X-RAY DIFFRACTION
Materials and Methods page
3ZLT
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details pH 7
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.01 α = 90
    b = 113.17 β = 90
    c = 226.35 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 2010-06-03
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength 1.00
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.6
    Resolution(Low) 29.22
    Number Reflections(Observed) 63495
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.09
    B(Isotropic) From Wilson Plot 48.97
    Redundancy 7.4
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.72
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.44
    Mean I Over Sigma(Observed) 3.5
    Redundancy 7.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 2.6
    Resolution(Low) 29.22
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 63450
    Number of Reflections(R-Free) 1260
    Percent Reflections(Observed) 99.09
    R-Factor(Observed) 0.1712
    R-Work 0.1704
    R-Free 0.2152
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.5365
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.391
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.9275
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.704
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6802
    R-Factor(R-Work) 0.2445
    R-Factor(R-Free) 0.2882
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.704
    Shell Resolution(Low) 2.827
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 6801
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.3128
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.827
    Shell Resolution(Low) 2.9759
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6844
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2919
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9759
    Shell Resolution(Low) 3.1622
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6826
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.2265
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1622
    Shell Resolution(Low) 3.406
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 6854
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.217
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.406
    Shell Resolution(Low) 3.7481
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6902
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.2242
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7481
    Shell Resolution(Low) 4.289
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6931
    R-Factor(R-Work) 0.1423
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.289
    Shell Resolution(Low) 5.3981
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 6998
    R-Factor(R-Work) 0.1311
    R-Factor(R-Free) 0.1643
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3981
    Shell Resolution(Low) 29.2216
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 7232
    R-Factor(R-Work) 0.1664
    R-Factor(R-Free) 0.2081
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.079
    f_dihedral_angle_d 15.995
    f_angle_d 1.169
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8363
    Nucleic Acid Atoms 0
    Heterogen Atoms 69
    Solvent Atoms 613
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution REFMAC
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building REFMAC