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X-RAY DIFFRACTION
Materials and Methods page
3ZLR
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.5
    Details 1.6 M (NH4)2 SO4, 100 MM MES PH 5.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.24 α = 90
    b = 56.24 β = 90
    c = 211.95 γ = 90
     
    Space Group
    Space Group Name:    P 43 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE (RAXIS-IV)
    Type RIGAKU
    Details MEECO CAPILLARY
    Collection Date 2007-10-25
     
    Diffraction Radiation
    Monochromator NI FILTER
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.03
    Resolution(Low) 49.68
    Number Reflections(Observed) 22506
    Percent Possible(Observed) 97.2
    R Merge I(Observed) 0.12
    Redundancy 86.57
     
    High Resolution Shell Details
    Resolution(High) 2.03
    Resolution(Low) 2.1
    Percent Possible(All) 86.6
    R Merge I(Observed) 0.5
    Mean I Over Sigma(Observed) 4.28
    Redundancy 10.78
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.026
    Resolution(Low) 44.001
    Cut-off Sigma(F) 2.02
    Number of Reflections(Observed) 22506
    Number of Reflections(R-Free) 1152
    Percent Reflections(Observed) 97.15
    R-Factor(Observed) 0.1606
    R-Work 0.1582
    R-Free 0.208
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0263
    Shell Resolution(Low) 2.1185
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2353
    R-Factor(R-Work) 0.2021
    R-Factor(R-Free) 0.2334
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1185
    Shell Resolution(Low) 2.2302
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.1686
    R-Factor(R-Free) 0.2288
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2302
    Shell Resolution(Low) 2.3699
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1616
    R-Factor(R-Free) 0.236
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3699
    Shell Resolution(Low) 2.5529
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.1602
    R-Factor(R-Free) 0.2409
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5529
    Shell Resolution(Low) 2.8097
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.2099
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8097
    Shell Resolution(Low) 3.2162
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2162
    Shell Resolution(Low) 4.0516
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2784
    R-Factor(R-Work) 0.1382
    R-Factor(R-Free) 0.177
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0516
    Shell Resolution(Low) 44.0118
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2986
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.065
    f_dihedral_angle_d 12.914
    f_angle_d 1.196
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2330
    Nucleic Acid Atoms 0
    Heterogen Atoms 105
    Solvent Atoms 262
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8.1_1168)
    model building PHASER