X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
pH 5.5
Details 1.6 M (NH4)2 SO4, 100 MM MES PH 5.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.24 α = 90
b = 56.24 β = 90
c = 211.95 γ = 90
Symmetry
Space Group P 43 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE (RAXIS-IV) RIGAKU MEECO CAPILLARY 2007-10-25
Diffraction Radiation
Monochromator Protocol
NI FILTER SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.03 49.68 97.2 0.12 -- -- 86.57 -- 22506 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.03 2.1 86.6 0.5 -- 4.28 10.78 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.026 44.001 -- 2.02 -- 22506 1152 97.15 -- 0.1606 0.1582 0.208 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0263 2.1185 -- 132 2353 0.2021 0.2334 -- 88.0
X Ray Diffraction 2.1185 2.2302 -- 147 2590 0.1686 0.2288 -- 97.0
X Ray Diffraction 2.2302 2.3699 -- 160 2606 0.1616 0.236 -- 97.0
X Ray Diffraction 2.3699 2.5529 -- 132 2672 0.1602 0.2409 -- 98.0
X Ray Diffraction 2.5529 2.8097 -- 164 2642 0.1609 0.2099 -- 98.0
X Ray Diffraction 2.8097 3.2162 -- 127 2721 0.1619 0.2243 -- 99.0
X Ray Diffraction 3.2162 4.0516 -- 146 2784 0.1382 0.177 -- 99.0
X Ray Diffraction 4.0516 44.0118 -- 144 2986 0.1561 0.1838 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.065
f_dihedral_angle_d 12.914
f_angle_d 1.196
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2330
Nucleic Acid Atoms 0
Heterogen Atoms 105
Solvent Atoms 262

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE: 1.8.1_1168) refinement
PHASER model building