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X-RAY DIFFRACTION
Materials and Methods page
3ZLN
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details 1.8 M (NH4)2 SO4, 40 MM MG2 SO4, 10 MM TRIS PH 8.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.91 α = 90
    b = 65.91 β = 90
    c = 115.07 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector RAXIS-IV
    Type RIGAKU
    Details MEECO CAPILLARY
    Collection Date 2006-10-25
     
    Diffraction Radiation
    Monochromator NI FILTER
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.29
    Resolution(Low) 50
    Number Reflections(Observed) 11658
    Percent Possible(Observed) 96.8
    R Merge I(Observed) 0.13
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 2.29
    Resolution(Low) 2.37
    Percent Possible(All) 93.2
    R Merge I(Observed) 0.5
    Mean I Over Sigma(Observed) 2.75
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.288
    Resolution(Low) 31.682
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 11658
    Number of Reflections(R-Free) 551
    Percent Reflections(Observed) 96.82
    R-Factor(Observed) 0.1864
    R-Work 0.1835
    R-Free 0.2465
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2878
    Shell Resolution(Low) 2.518
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.238
    R-Factor(R-Free) 0.2989
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.518
    Shell Resolution(Low) 2.8821
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.2872
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8821
    Shell Resolution(Low) 3.6303
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2769
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.225
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6303
    Shell Resolution(Low) 31.6849
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2965
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.2254
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.078
    f_dihedral_angle_d 13.109
    f_angle_d 1.14
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1161
    Nucleic Acid Atoms 0
    Heterogen Atoms 55
    Solvent Atoms 146
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8.1_1168)
    model building PHASER