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X-RAY DIFFRACTION
Materials and Methods page
3ZK6
  •   Crystallization Hide
    Crystallization Experiments
    Details 2.2 M (NH4)2 SO4, 0.1 M BIS TRIS, PH 5.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.2 α = 90
    b = 65.2 β = 90
    c = 117.21 γ = 90
     
    Space Group
    Space Group Name:    P 41
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Collection Date 2006-06-20
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-6A
    Wavelength 0.96426
    Site PHOTON FACTORY
    Beamline BL-6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.48
    Resolution(Low) 46.1
    Number Reflections(Observed) 17277
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.09
    Redundancy 7.45
     
    High Resolution Shell Details
    Resolution(High) 2.48
    Resolution(Low) 2.57
    Percent Possible(All) 94.2
    R Merge I(Observed) 0.9
    Mean I Over Sigma(Observed) 2.58
    Redundancy 7.14
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.48
    Resolution(Low) 46.103
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 17274
    Number of Reflections(R-Free) 871
    Percent Reflections(Observed) 99.42
    R-Factor(Observed) 0.2215
    R-Work 0.2214
    R-Free 0.2607
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4807
    Shell Resolution(Low) 2.6361
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.2659
    R-Factor(R-Free) 0.3492
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6361
    Shell Resolution(Low) 2.8395
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.2485
    R-Factor(R-Free) 0.3198
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8395
    Shell Resolution(Low) 3.1249
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.2342
    R-Factor(R-Free) 0.2505
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1249
    Shell Resolution(Low) 3.5764
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.2221
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5764
    Shell Resolution(Low) 4.5032
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2737
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2348
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5032
    Shell Resolution(Low) 29.1603
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2788
    R-Factor(R-Work) 0.212
    R-Factor(R-Free) 0.2464
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.082
    f_dihedral_angle_d 19.667
    f_angle_d 1.312
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2334
    Nucleic Acid Atoms 0
    Heterogen Atoms 82
    Solvent Atoms 54
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER