X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Details 2.2 M (NH4)2 SO4, 0.1 M BIS TRIS, PH 5.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 65.2 α = 90
b = 65.2 β = 90
c = 117.21 γ = 90
Symmetry
Space Group P 41

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
-- -- -- 2006-06-20
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6A -- PHOTON FACTORY BL-6A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.48 46.1 99.4 0.09 -- -- 7.45 -- 17277 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.48 2.57 94.2 0.9 -- 2.58 7.14 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.48 46.103 -- 2.0 -- 17274 871 99.42 -- 0.2215 0.2214 0.2607 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4807 2.6361 -- 141 2647 0.2659 0.3492 -- 92.0
X Ray Diffraction 2.6361 2.8395 -- 144 2739 0.2485 0.3198 -- 95.0
X Ray Diffraction 2.8395 3.1249 -- 146 2741 0.2342 0.2505 -- 95.0
X Ray Diffraction 3.1249 3.5764 -- 144 2741 0.2221 0.2797 -- 95.0
X Ray Diffraction 3.5764 4.5032 -- 144 2737 0.2005 0.2348 -- 95.0
X Ray Diffraction 4.5032 29.1603 -- 147 2788 0.212 0.2464 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.082
f_dihedral_angle_d 19.667
f_angle_d 1.312
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2334
Nucleic Acid Atoms 0
Heterogen Atoms 82
Solvent Atoms 54

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
PHASER model building