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X-RAY DIFFRACTION
Materials and Methods page
3ZHE
  •   Crystallization Hide
    Crystallization Experiments
    pH 5
    Details 0.1 M SODIUM CITRATE (PH 5.0), 8% (W/V) PEG 8000, 10% GLYCEROL, 500 MM NACL, 60 MM (NH4)2SO4, 4 MM DTT AND 2 MM TCEP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 248.16 α = 90
    b = 82 β = 116.88
    c = 154.51 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Details MIRRORS
    Collection Date 2011-07-18
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 0.979300
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3
    Resolution(Low) 50
    Number Reflections(Observed) 55840
    Percent Possible(Observed) 99.7
    B(Isotropic) From Wilson Plot 94.31
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.2
    Percent Possible(All) 99.8
    Mean I Over Sigma(Observed) 2.37
    R-Sym I(Observed) 0.73
    Redundancy 6.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MIRAS
    reflnsShellList 3.0
    Resolution(Low) 49.337
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 55765
    Number of Reflections(R-Free) 2826
    Percent Reflections(Observed) 99.8
    R-Factor(Observed) 0.2232
    R-Work 0.2218
    R-Free 0.2487
     
    Temperature Factor Modeling
    Mean Isotropic B Value 105.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.0517
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.3606
    R-Factor(R-Free) 0.4242
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0517
    Shell Resolution(Low) 3.1072
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.346
    R-Factor(R-Free) 0.4218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1072
    Shell Resolution(Low) 3.167
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.3229
    R-Factor(R-Free) 0.3673
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.167
    Shell Resolution(Low) 3.2316
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.3106
    R-Factor(R-Free) 0.3637
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2316
    Shell Resolution(Low) 3.3019
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2919
    R-Factor(R-Free) 0.3275
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3019
    Shell Resolution(Low) 3.3787
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.2714
    R-Factor(R-Free) 0.3032
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3787
    Shell Resolution(Low) 3.4631
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.2722
    R-Factor(R-Free) 0.3356
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4631
    Shell Resolution(Low) 3.5567
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.252
    R-Factor(R-Free) 0.3175
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5567
    Shell Resolution(Low) 3.6614
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.2459
    R-Factor(R-Free) 0.2377
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6614
    Shell Resolution(Low) 3.7795
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.2392
    R-Factor(R-Free) 0.3069
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7795
    Shell Resolution(Low) 3.9145
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.2178
    R-Factor(R-Free) 0.273
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9145
    Shell Resolution(Low) 4.0712
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0712
    Shell Resolution(Low) 4.2564
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.2187
    R-Factor(R-Free) 0.2342
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2564
    Shell Resolution(Low) 4.4807
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.2094
    R-Factor(R-Free) 0.2644
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4807
    Shell Resolution(Low) 4.7612
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2034
    R-Factor(R-Free) 0.2409
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7612
    Shell Resolution(Low) 5.1284
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.2114
    R-Factor(R-Free) 0.225
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1284
    Shell Resolution(Low) 5.6439
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6439
    Shell Resolution(Low) 6.459
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.236
    R-Factor(R-Free) 0.2984
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.459
    Shell Resolution(Low) 8.1318
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.2085
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.1318
    Shell Resolution(Low) 49.3436
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.1721
    R-Factor(R-Free) 0.1645
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.047
    f_dihedral_angle_d 13.404
    f_angle_d 0.685
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12141
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELX
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8.1_1168)
    model building SHELX