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X-RAY DIFFRACTION
Materials and Methods page
3ZH8
  •   Crystallization Hide
    Crystallization Experiments
    Details 0.2M AMMONIUM IODIDE AND 20%(W/V) PEG3350.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 113.58 α = 90
    b = 113.58 β = 90
    c = 82.41 γ = 120
     
    Space Group
    Space Group Name:    P 31
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 199
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Details MIRRORS
    Collection Date 2008-01-27
     
    Diffraction Radiation
    Monochromator SI CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I03
    Wavelength 0.92
    Site DIAMOND
    Beamline I03
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.2
    Resolution(High) 2.74
    Resolution(Low) 49.21
    Number Reflections(Observed) 31307
    Percent Possible(Observed) 95.6
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 50.84
    Redundancy 1.94
     
    High Resolution Shell Details
    Resolution(High) 2.74
    Resolution(Low) 2.89
    Percent Possible(All) 95.1
    R Merge I(Observed) 0.62
    Mean I Over Sigma(Observed) 1.24
    Redundancy 1.88
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.739
    Resolution(Low) 42.233
    Cut-off Sigma(F) 2.03
    Number of Reflections(Observed) 31270
    Number of Reflections(R-Free) 1576
    Percent Reflections(Observed) 99.97
    R-Factor(Observed) 0.2126
    R-Work 0.2103
    R-Free 0.2568
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7392
    Shell Resolution(Low) 2.8276
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.2974
    R-Factor(R-Free) 0.3399
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8276
    Shell Resolution(Low) 2.9287
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.2762
    R-Factor(R-Free) 0.3213
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9287
    Shell Resolution(Low) 3.0459
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.2562
    R-Factor(R-Free) 0.2835
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0459
    Shell Resolution(Low) 3.1845
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.2559
    R-Factor(R-Free) 0.3454
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1845
    Shell Resolution(Low) 3.3523
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.2369
    R-Factor(R-Free) 0.3416
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3523
    Shell Resolution(Low) 3.5622
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.2229
    R-Factor(R-Free) 0.2638
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5622
    Shell Resolution(Low) 3.8371
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8371
    Shell Resolution(Low) 4.2229
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.1868
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2229
    Shell Resolution(Low) 4.8332
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.1662
    R-Factor(R-Free) 0.213
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8332
    Shell Resolution(Low) 6.0865
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.1928
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0865
    Shell Resolution(Low) 42.2376
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.2081
    R-Factor(R-Free) 0.204
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.045
    f_dihedral_angle_d 11.665
    f_angle_d 0.687
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7496
    Nucleic Acid Atoms 0
    Heterogen Atoms 145
    Solvent Atoms 73
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) IMOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8.1_1168)
    model building PHASER