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X-RAY DIFFRACTION
Materials and Methods page
3ZH4
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.6
    Details 0.2 M AMMONIUM ACETATE, 0.1 M SODIUM CITRATE TRIBASIC DIHYDRATE, PH 5.6, 30% PEG 4000
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 106.58 α = 90
    b = 70.36 β = 90
    c = 45.24 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 2M)
    Type DECTRIS
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength 1.0000
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.3
    Resolution(High) 1.8
    Resolution(Low) 45.2
    Number Reflections(Observed) 32208
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.14
    Redundancy 12.7
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.9
    Percent Possible(All) 99.7
    Mean I Over Sigma(Observed) 2.3
    Redundancy 13.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 45.241
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 32208
    Number of Reflections(R-Free) 1634
    Percent Reflections(Observed) 99.73
    R-Factor(Observed) 0.1626
    R-Work 0.1603
    R-Free 0.2042
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8004
    Shell Resolution(Low) 1.8534
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2420
    R-Factor(R-Work) 0.2342
    R-Factor(R-Free) 0.3074
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8534
    Shell Resolution(Low) 1.9132
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2500
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9132
    Shell Resolution(Low) 1.9816
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9816
    Shell Resolution(Low) 2.061
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.2177
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.061
    Shell Resolution(Low) 2.1547
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2508
    R-Factor(R-Work) 0.1678
    R-Factor(R-Free) 0.2308
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1547
    Shell Resolution(Low) 2.2683
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2524
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2683
    Shell Resolution(Low) 2.4105
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2546
    R-Factor(R-Work) 0.155
    R-Factor(R-Free) 0.2185
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4105
    Shell Resolution(Low) 2.5966
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.2023
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5966
    Shell Resolution(Low) 2.8578
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2533
    R-Factor(R-Work) 0.1653
    R-Factor(R-Free) 0.2152
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8578
    Shell Resolution(Low) 3.2712
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2572
    R-Factor(R-Work) 0.1623
    R-Factor(R-Free) 0.1833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2712
    Shell Resolution(Low) 4.121
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1357
    R-Factor(R-Free) 0.1921
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.121
    Shell Resolution(Low) 45.2553
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2724
    R-Factor(R-Work) 0.1502
    R-Factor(R-Free) 0.1727
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 12.849
    f_angle_d 1.07
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3106
    Nucleic Acid Atoms 0
    Heterogen Atoms 20
    Solvent Atoms 347
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER