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X-RAY DIFFRACTION
Materials and Methods page
3ZGX
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 8 % ISOPROPANOL, 20 MM MAGNESIUM CHLORIDE AND 50 MM MES PH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 107.43 α = 90
    b = 107.43 β = 90
    c = 102.82 γ = 90
     
    Space Group
    Space Group Name:    P 43
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Collection Date 2011-12-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 0.9793
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.3
    Resolution(High) 3.4
    Resolution(Low) 75.97
    Number Reflections(Observed) 16156
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.09
    Redundancy 9.5
     
    High Resolution Shell Details
    Resolution(High) 3.4
    Resolution(Low) 3.58
    Percent Possible(All) 99.2
    R Merge I(Observed) 0.58
    Mean I Over Sigma(Observed) 3.3
    Redundancy 9.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 3.4
    Resolution(Low) 75.968
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 16156
    Number of Reflections(R-Free) 1581
    Percent Reflections(Observed) 99.72
    R-Factor(Observed) 0.2418
    R-Work 0.243
    R-Free 0.277
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.402
    Shell Resolution(Low) 3.5118
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.302
    R-Factor(R-Free) 0.3146
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5118
    Shell Resolution(Low) 3.6373
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.2899
    R-Factor(R-Free) 0.3016
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6373
    Shell Resolution(Low) 3.7829
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.2805
    R-Factor(R-Free) 0.3239
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7829
    Shell Resolution(Low) 3.9551
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.269
    R-Factor(R-Free) 0.3663
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9551
    Shell Resolution(Low) 4.1636
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.2623
    R-Factor(R-Free) 0.2914
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1636
    Shell Resolution(Low) 4.4244
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.2469
    R-Factor(R-Free) 0.2687
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4244
    Shell Resolution(Low) 4.766
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.2197
    R-Factor(R-Free) 0.2745
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.766
    Shell Resolution(Low) 5.2455
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.2168
    R-Factor(R-Free) 0.2326
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2455
    Shell Resolution(Low) 6.0043
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.2452
    R-Factor(R-Free) 0.3261
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0043
    Shell Resolution(Low) 7.5636
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.2595
    R-Factor(R-Free) 0.3282
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.5636
    Shell Resolution(Low) 74.3007
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.2024
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.11
    f_dihedral_angle_d 19.439
    f_angle_d 1.573
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6349
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX