X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6.5
Details pH 6.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.83 α = 90
b = 71.79 β = 90
c = 116.92 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD (QUANTUM 315R) ADSC DOUBLE CRYSTAL SI(111) --
Diffraction Radiation
Monochromator Protocol
DOUBLE FLAT CRYSTAL, SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 -- ALS 8.3.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 47.7 99.9 0.11 -- -- 4.0 -- 27780 -- 2.0 27.28
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.24 100.0 0.7 -- 2.0 4.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.203 47.704 -- 1.34 -- 27780 2000 99.77 -- 0.1821 0.1778 0.2398 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2034 2.2585 -- 137 1764 0.2221 0.2509 -- 98.0
X Ray Diffraction 2.2585 2.3195 -- 141 1816 0.2185 0.283 -- 100.0
X Ray Diffraction 2.3195 2.3878 -- 141 1810 0.2046 0.2954 -- 100.0
X Ray Diffraction 2.3878 2.4649 -- 141 1833 0.1982 0.2822 -- 100.0
X Ray Diffraction 2.4649 2.553 -- 142 1823 0.19 0.2749 -- 100.0
X Ray Diffraction 2.553 2.6552 -- 142 1824 0.19 0.2752 -- 100.0
X Ray Diffraction 2.6552 2.776 -- 140 1819 0.1937 0.3001 -- 100.0
X Ray Diffraction 2.776 2.9223 -- 142 1831 0.1858 0.2543 -- 100.0
X Ray Diffraction 2.9223 3.1054 -- 143 1829 0.1887 0.2755 -- 100.0
X Ray Diffraction 3.1054 3.3451 -- 143 1845 0.1827 0.266 -- 100.0
X Ray Diffraction 3.3451 3.6816 -- 143 1852 0.1593 0.2321 -- 100.0
X Ray Diffraction 3.6816 4.2141 -- 144 1863 0.1466 0.1966 -- 100.0
X Ray Diffraction 4.2141 5.3082 -- 147 1888 0.1556 0.1739 -- 100.0
X Ray Diffraction 5.3082 47.7149 -- 154 1983 0.1834 0.2332 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.08
f_dihedral_angle_d 15.72
f_angle_d 1.121
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3885
Nucleic Acid Atoms 0
Heterogen Atoms 7
Solvent Atoms 232

Software

Computing
Computing Package Purpose
HKL2000 Data Reduction (intensity integration)
HKL2000 Data Reduction (data scaling)
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement