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X-RAY DIFFRACTION
Materials and Methods page
3ZGN
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 24% PEG 3350, 0.1 M BIS-TRIS PH6.5, 200 MM LISO4
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 112.39 α = 90
    b = 80.57 β = 94.46
    c = 70.62 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type ADSC
    Collection Date 2011-02-12
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 0.979
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.95
    Resolution(Low) 46.9
    Number Reflections(Observed) 43163
    Percent Possible(Observed) 94.1
    R Merge I(Observed) 0.07
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.05
    Percent Possible(All) 99.0
    R Merge I(Observed) 0.45
    Mean I Over Sigma(Observed) 2.5
    Redundancy 3.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 46.87
    Number of Reflections(Observed) 41004
    Number of Reflections(R-Free) 2159
    Percent Reflections(Observed) 94.1
    R-Factor(Observed) 0.20736
    R-Work 0.20474
    R-Free 0.25809
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 29.811
    Anisotropic B[1][1] 1.43
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.02
    Anisotropic B[2][2] -1.72
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.21
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.001
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3166
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.318
    Percent Reflections(Observed) 98.46
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_sphericity_bonded 9.341
    r_sphericity_free 19.242
    r_rigid_bond_restr 5.26
    r_gen_planes_other 0.002
    r_gen_planes_refined 0.004
    r_chiral_restr 0.097
    r_dihedral_angle_4_deg 15.066
    r_dihedral_angle_3_deg 15.358
    r_dihedral_angle_2_deg 37.135
    r_dihedral_angle_1_deg 4.755
    r_angle_other_deg 1.604
    r_angle_refined_deg 1.26
    r_bond_other_d 0.002
    r_bond_refined_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4766
    Nucleic Acid Atoms 0
    Heterogen Atoms 46
    Solvent Atoms 442
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement REFMAC 5.7.0029
     
    Software
    refinement REFMAC version: 5.7.0029
    model building PHASER