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X-RAY DIFFRACTION
Materials and Methods page
3ZGL
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 24% PEG 3350, 0.1 M BIS-TRIS PH6.5, 200 MM LISO4
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 112.12 α = 90
    b = 80.65 β = 94.63
    c = 71.09 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Collection Date 2011-02-12
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 0.979
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.7
    Resolution(Low) 46.96
    Number Reflections(Observed) 68152
    Percent Possible(Observed) 94.9
    R Merge I(Observed) 0.09
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.8
    Percent Possible(All) 94.6
    R Merge I(Observed) 0.4
    Mean I Over Sigma(Observed) 2.8
    Redundancy 3.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.68
    Resolution(Low) 46.96
    Number of Reflections(Observed) 64744
    Number of Reflections(R-Free) 3408
    Percent Reflections(Observed) 94.96
    R-Factor(Observed) 0.19001
    R-Work 0.18725
    R-Free 0.24179
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 23.073
    Anisotropic B[1][1] 2.57
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.27
    Anisotropic B[2][2] -2.97
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.37
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.68
    Shell Resolution(Low) 1.724
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 4643
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.275
    Percent Reflections(Observed) 93.37
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_sphericity_bonded 9.133
    r_sphericity_free 20.899
    r_rigid_bond_restr 12.069
    r_gen_planes_other 0.004
    r_gen_planes_refined 0.006
    r_chiral_restr 0.131
    r_dihedral_angle_4_deg 18.93
    r_dihedral_angle_3_deg 14.227
    r_dihedral_angle_2_deg 39.146
    r_dihedral_angle_1_deg 5.216
    r_angle_other_deg 1.758
    r_angle_refined_deg 1.888
    r_bond_other_d 0.002
    r_bond_refined_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4753
    Nucleic Acid Atoms 0
    Heterogen Atoms 46
    Solvent Atoms 809
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement REFMAC 5.7.0029
     
    Software
    refinement REFMAC version: 5.7.0029
    model building PHASER