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X-RAY DIFFRACTION
Materials and Methods page
3ZGF
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 7-12% POLYETHYLENE GLYCOL 3350, 0.1 - 0.3 M AMMONIUM SULPHATE, 0.05 M MNCL2, 0.05 M MOPS PH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 52.84 α = 90
    b = 78.45 β = 90
    c = 155.13 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (SX-165)
    Type MARRESEARCH
    Details MULTILAYER MIRROR
     
    Diffraction Radiation
    Monochromator BENT SI (220) CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-5
    Wavelength 0.90772
    Site MAX II
    Beamline I911-5
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.96
    Resolution(High) 1.7
    Resolution(Low) 20
    Number Reflections(Observed) 71207
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 20.24
    Redundancy 7.0
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.85
    Percent Possible(All) 96.2
    R Merge I(Observed) 0.63
    Mean I Over Sigma(Observed) 2.96
    Redundancy 6.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.701
    Resolution(Low) 19.984
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 71129
    Number of Reflections(R-Free) 2134
    Percent Reflections(Observed) 99.34
    R-Factor(Observed) 0.1827
    R-Work 0.1816
    R-Free 0.2173
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.1346
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0282
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.1064
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7012
    Shell Resolution(Low) 1.7407
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 4110
    R-Factor(R-Work) 0.3378
    R-Factor(R-Free) 0.4186
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7407
    Shell Resolution(Low) 1.7842
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4589
    R-Factor(R-Work) 0.2727
    R-Factor(R-Free) 0.2917
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7842
    Shell Resolution(Low) 1.8325
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4555
    R-Factor(R-Work) 0.2394
    R-Factor(R-Free) 0.3003
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8325
    Shell Resolution(Low) 1.8863
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4583
    R-Factor(R-Work) 0.2175
    R-Factor(R-Free) 0.2486
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8863
    Shell Resolution(Low) 1.9472
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4559
    R-Factor(R-Work) 0.2086
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9472
    Shell Resolution(Low) 2.0167
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4612
    R-Factor(R-Work) 0.1922
    R-Factor(R-Free) 0.2187
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0167
    Shell Resolution(Low) 2.0974
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4571
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2692
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0974
    Shell Resolution(Low) 2.1927
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4609
    R-Factor(R-Work) 0.1887
    R-Factor(R-Free) 0.2428
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1927
    Shell Resolution(Low) 2.3082
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4625
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2432
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3082
    Shell Resolution(Low) 2.4525
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4591
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4525
    Shell Resolution(Low) 2.6415
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4658
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2368
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6415
    Shell Resolution(Low) 2.9066
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4640
    R-Factor(R-Work) 0.1892
    R-Factor(R-Free) 0.2332
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9066
    Shell Resolution(Low) 3.3255
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4659
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.2223
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3255
    Shell Resolution(Low) 4.1835
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 4721
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.1744
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1835
    Shell Resolution(Low) 19.9853
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 4913
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.1582
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.079
    f_dihedral_angle_d 15.496
    f_angle_d 1.107
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4697
    Nucleic Acid Atoms 0
    Heterogen Atoms 83
    Solvent Atoms 527
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER