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X-RAY DIFFRACTION
Materials and Methods page
3ZD4
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 50.14 α = 90
    b = 68.45 β = 112.56
    c = 60.22 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL7-1
    Wavelength 1.097173
    Site SSRL
    Beamline BL7-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.2
    Resolution(Low) 38.35
    Number Reflections(Observed) 9191
    Percent Possible(Observed) 96.1
    R Merge I(Observed) 0.03
    B(Isotropic) From Wilson Plot 53.23
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.32
    Percent Possible(All) 98.2
    R Merge I(Observed) 0.31
    Mean I Over Sigma(Observed) 3.8
    Redundancy 4.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 20.216
    Cut-off Sigma(F) 1.44
    Number of Reflections(Observed) 9162
    Number of Reflections(R-Free) 907
    Percent Reflections(Observed) 95.42
    R-Factor(Observed) 0.1876
    R-Work 0.182
    R-Free 0.236
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2001
    Shell Resolution(Low) 2.3377
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1396
    R-Factor(R-Work) 0.2845
    R-Factor(R-Free) 0.3744
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3377
    Shell Resolution(Low) 2.5179
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1408
    R-Factor(R-Work) 0.2933
    R-Factor(R-Free) 0.3505
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5179
    Shell Resolution(Low) 2.7707
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1388
    R-Factor(R-Work) 0.284
    R-Factor(R-Free) 0.3894
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7707
    Shell Resolution(Low) 3.1703
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1410
    R-Factor(R-Work) 0.233
    R-Factor(R-Free) 0.3075
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1703
    Shell Resolution(Low) 3.9892
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1384
    R-Factor(R-Work) 0.1487
    R-Factor(R-Free) 0.1917
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9892
    Shell Resolution(Low) 20.2172
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1269
    R-Factor(R-Work) 0.1283
    R-Factor(R-Free) 0.1659
    Percent Reflections(Observed) 86.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.04
    f_dihedral_angle_d 14.735
    f_angle_d 0.938
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 0
    Nucleic Acid Atoms 1343
    Heterogen Atoms 0
    Solvent Atoms 31
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) IMOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER