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X-RAY DIFFRACTION
Materials and Methods page
3ZD3
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 50.82 α = 90
    b = 68.53 β = 112.35
    c = 58.9 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-325)
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.55
    Resolution(Low) 20.39
    Number Reflections(Observed) 26462
    Percent Possible(Observed) 97.6
    R Merge I(Observed) 0.03
    Redundancy 3.0
     
    High Resolution Shell Details
    Resolution(High) 1.55
    Resolution(Low) 1.63
    Percent Possible(All) 99.6
    R Merge I(Observed) 0.63
    Mean I Over Sigma(Observed) 1.8
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.55
    Resolution(Low) 20.39
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 26446
    Number of Reflections(R-Free) 2002
    Percent Reflections(Observed) 97.48
    R-Factor(Observed) 0.1875
    R-Work 0.185
    R-Free 0.2185
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.55
    Shell Resolution(Low) 1.5888
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1797
    R-Factor(R-Work) 0.3104
    R-Factor(R-Free) 0.3507
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5888
    Shell Resolution(Low) 1.6317
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1775
    R-Factor(R-Work) 0.2766
    R-Factor(R-Free) 0.2924
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6317
    Shell Resolution(Low) 1.6797
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1753
    R-Factor(R-Work) 0.2497
    R-Factor(R-Free) 0.2849
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6797
    Shell Resolution(Low) 1.7339
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1780
    R-Factor(R-Work) 0.2306
    R-Factor(R-Free) 0.2716
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7339
    Shell Resolution(Low) 1.7958
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1774
    R-Factor(R-Work) 0.2194
    R-Factor(R-Free) 0.2652
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7958
    Shell Resolution(Low) 1.8677
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1775
    R-Factor(R-Work) 0.2213
    R-Factor(R-Free) 0.2721
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8677
    Shell Resolution(Low) 1.9526
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1797
    R-Factor(R-Work) 0.2265
    R-Factor(R-Free) 0.2535
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9526
    Shell Resolution(Low) 2.0555
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1752
    R-Factor(R-Work) 0.2168
    R-Factor(R-Free) 0.2474
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0555
    Shell Resolution(Low) 2.1841
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1774
    R-Factor(R-Work) 0.2157
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1841
    Shell Resolution(Low) 2.3525
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1780
    R-Factor(R-Work) 0.2048
    R-Factor(R-Free) 0.2521
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3525
    Shell Resolution(Low) 2.5888
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1751
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2432
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5888
    Shell Resolution(Low) 2.9625
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1759
    R-Factor(R-Work) 0.2033
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9625
    Shell Resolution(Low) 3.7287
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1700
    R-Factor(R-Work) 0.144
    R-Factor(R-Free) 0.1912
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7287
    Shell Resolution(Low) 20.3919
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 1477
    R-Factor(R-Work) 0.1482
    R-Factor(R-Free) 0.1665
    Percent Reflections(Observed) 80.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.042
    f_dihedral_angle_d 14.425
    f_angle_d 0.975
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 0
    Nucleic Acid Atoms 1344
    Heterogen Atoms 11
    Solvent Atoms 301
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (data scaling) IMOSFLM
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER