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X-RAY DIFFRACTION
Materials and Methods page
3ZCW
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.9
    Details 20% PEG3350, 2MM MAGNESIUM CHLORIDE, 100MM HEPES PH 7.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 107.94 α = 90
    b = 62.89 β = 117.46
    c = 75.05 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2011-09-18
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 0.979500
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.69
    Resolution(Low) 36.96
    Number Reflections(Observed) 49475
    Percent Possible(Observed) 99.2
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 21.73
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 1.69
    Resolution(Low) 1.78
    Percent Possible(All) 99.2
    R Merge I(Observed) 0.66
    Mean I Over Sigma(Observed) 2.0
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.691
    Resolution(Low) 28.468
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 49418
    Number of Reflections(R-Free) 2504
    Percent Reflections(Observed) 99.03
    R-Factor(Observed) 0.196
    R-Work 0.1941
    R-Free 0.2328
     
    Temperature Factor Modeling
    Mean Isotropic B Value 29.84
    Anisotropic B[1][1] -2.5704
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.116
    Anisotropic B[2][2] -0.0374
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.6078
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.691
    Shell Resolution(Low) 1.7235
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2543
    R-Factor(R-Work) 0.3007
    R-Factor(R-Free) 0.2991
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7235
    Shell Resolution(Low) 1.7587
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.2712
    R-Factor(R-Free) 0.2817
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7587
    Shell Resolution(Low) 1.7969
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.2554
    R-Factor(R-Free) 0.3142
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7969
    Shell Resolution(Low) 1.8387
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.2441
    R-Factor(R-Free) 0.3036
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8387
    Shell Resolution(Low) 1.8847
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.2646
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8847
    Shell Resolution(Low) 1.9357
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.3546
    R-Factor(R-Free) 0.4028
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9357
    Shell Resolution(Low) 1.9926
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.2476
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9926
    Shell Resolution(Low) 2.0569
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1793
    R-Factor(R-Free) 0.2224
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0569
    Shell Resolution(Low) 2.1304
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2141
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1304
    Shell Resolution(Low) 2.2157
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2157
    Shell Resolution(Low) 2.3164
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.2799
    R-Factor(R-Free) 0.3309
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3164
    Shell Resolution(Low) 2.4385
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.1867
    R-Factor(R-Free) 0.2191
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4385
    Shell Resolution(Low) 2.5912
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1772
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5912
    Shell Resolution(Low) 2.7911
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1819
    R-Factor(R-Free) 0.2614
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7911
    Shell Resolution(Low) 3.0717
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1755
    R-Factor(R-Free) 0.2483
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0717
    Shell Resolution(Low) 3.5155
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.1653
    R-Factor(R-Free) 0.189
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5155
    Shell Resolution(Low) 4.4264
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.1974
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4264
    Shell Resolution(Low) 28.4721
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.17
    R-Factor(R-Free) 0.1668
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.092
    f_dihedral_angle_d 15.965
    f_angle_d 1.414
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2496
    Nucleic Acid Atoms 0
    Heterogen Atoms 113
    Solvent Atoms 450
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP