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X-RAY DIFFRACTION
Materials and Methods page
3ZC0
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details 2.7 M 1,6-HEXANEDIOL, 200 MM AMMONIUM CHLORIDE, 10 MM MGCL2, 50 MM HEPES PH 8.0, 5 MM DTT.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 183.06 α = 90
    b = 183.06 β = 90
    c = 198.12 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M-F)
    Type DECTRIS
    Details KIRKPATRICK BAEZ BIMORPH MIRROR PAIR FOR HORIZONTAL AND VERTICAL FOCUSSING
    Collection Date 2011-07-03
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I03
    Wavelength 0.97630
    Site DIAMOND
    Beamline I03
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.98
    Resolution(Low) 123.78
    Number Reflections(Observed) 78522
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.11
    B(Isotropic) From Wilson Plot 66.77
    Redundancy 10.1
     
    High Resolution Shell Details
    Resolution(High) 2.98
    Resolution(Low) 3.06
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.83
    Mean I Over Sigma(Observed) 3.2
    Redundancy 10.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.982
    Resolution(Low) 83.091
    Cut-off Sigma(F) 1.22
    Number of Reflections(Observed) 78400
    Number of Reflections(R-Free) 7620
    Percent Reflections(Observed) 99.81
    R-Factor(Observed) 0.2103
    R-Work 0.2078
    R-Free 0.2572
     
    Temperature Factor Modeling
    Mean Isotropic B Value 56.38
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9816
    Shell Resolution(Low) 3.0155
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 4838
    R-Factor(R-Work) 0.3251
    R-Factor(R-Free) 0.3687
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0155
    Shell Resolution(Low) 3.051
    Number of Reflections(R-Free) 267
    Number of Reflections(R-Work) 4798
    R-Factor(R-Work) 0.3139
    R-Factor(R-Free) 0.3827
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.051
    Shell Resolution(Low) 3.0882
    Number of Reflections(R-Free) 257
    Number of Reflections(R-Work) 4780
    R-Factor(R-Work) 0.2874
    R-Factor(R-Free) 0.3201
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0882
    Shell Resolution(Low) 3.1273
    Number of Reflections(R-Free) 260
    Number of Reflections(R-Work) 4773
    R-Factor(R-Work) 0.281
    R-Factor(R-Free) 0.3255
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1273
    Shell Resolution(Low) 3.1685
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 4811
    R-Factor(R-Work) 0.2867
    R-Factor(R-Free) 0.3428
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1685
    Shell Resolution(Low) 3.2119
    Number of Reflections(R-Free) 310
    Number of Reflections(R-Work) 4744
    R-Factor(R-Work) 0.273
    R-Factor(R-Free) 0.3285
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2119
    Shell Resolution(Low) 3.2578
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 4766
    R-Factor(R-Work) 0.2765
    R-Factor(R-Free) 0.3119
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2578
    Shell Resolution(Low) 3.3064
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 4857
    R-Factor(R-Work) 0.2566
    R-Factor(R-Free) 0.3309
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3064
    Shell Resolution(Low) 3.358
    Number of Reflections(R-Free) 264
    Number of Reflections(R-Work) 4709
    R-Factor(R-Work) 0.2667
    R-Factor(R-Free) 0.3266
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.358
    Shell Resolution(Low) 3.4131
    Number of Reflections(R-Free) 243
    Number of Reflections(R-Work) 4859
    R-Factor(R-Work) 0.2693
    R-Factor(R-Free) 0.344
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4131
    Shell Resolution(Low) 3.472
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4772
    R-Factor(R-Work) 0.2579
    R-Factor(R-Free) 0.3247
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.472
    Shell Resolution(Low) 3.5351
    Number of Reflections(R-Free) 258
    Number of Reflections(R-Work) 4828
    R-Factor(R-Work) 0.2454
    R-Factor(R-Free) 0.3093
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5351
    Shell Resolution(Low) 3.6031
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 4791
    R-Factor(R-Work) 0.2309
    R-Factor(R-Free) 0.266
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6031
    Shell Resolution(Low) 3.6766
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 4785
    R-Factor(R-Work) 0.2227
    R-Factor(R-Free) 0.2942
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6766
    Shell Resolution(Low) 3.7566
    Number of Reflections(R-Free) 241
    Number of Reflections(R-Work) 4820
    R-Factor(R-Work) 0.2162
    R-Factor(R-Free) 0.2827
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7566
    Shell Resolution(Low) 3.844
    Number of Reflections(R-Free) 300
    Number of Reflections(R-Work) 4721
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.239
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.844
    Shell Resolution(Low) 3.9401
    Number of Reflections(R-Free) 262
    Number of Reflections(R-Work) 4809
    R-Factor(R-Work) 0.1902
    R-Factor(R-Free) 0.2553
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9401
    Shell Resolution(Low) 4.0466
    Number of Reflections(R-Free) 275
    Number of Reflections(R-Work) 4782
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0466
    Shell Resolution(Low) 4.1657
    Number of Reflections(R-Free) 299
    Number of Reflections(R-Work) 4750
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.2316
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1657
    Shell Resolution(Low) 4.3001
    Number of Reflections(R-Free) 240
    Number of Reflections(R-Work) 4788
    R-Factor(R-Work) 0.1734
    R-Factor(R-Free) 0.2136
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3001
    Shell Resolution(Low) 4.4538
    Number of Reflections(R-Free) 269
    Number of Reflections(R-Work) 4804
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4538
    Shell Resolution(Low) 4.6321
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 4767
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.2303
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6321
    Shell Resolution(Low) 4.8429
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4833
    R-Factor(R-Work) 0.1695
    R-Factor(R-Free) 0.2093
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8429
    Shell Resolution(Low) 5.0982
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 4780
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.2013
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0982
    Shell Resolution(Low) 5.4176
    Number of Reflections(R-Free) 247
    Number of Reflections(R-Work) 4773
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.2499
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4176
    Shell Resolution(Low) 5.8358
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 4840
    R-Factor(R-Work) 0.1953
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8358
    Shell Resolution(Low) 6.4229
    Number of Reflections(R-Free) 276
    Number of Reflections(R-Work) 4773
    R-Factor(R-Work) 0.1964
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4229
    Shell Resolution(Low) 7.3518
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 4780
    R-Factor(R-Work) 0.181
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.3518
    Shell Resolution(Low) 9.2605
    Number of Reflections(R-Free) 283
    Number of Reflections(R-Work) 4745
    R-Factor(R-Work) 0.1595
    R-Factor(R-Free) 0.1828
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.2605
    Shell Resolution(Low) 83.1234
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 4736
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.247
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.084
    f_dihedral_angle_d 18.898
    f_angle_d 1.242
    f_bond_d 0.021
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 18036
    Nucleic Acid Atoms 903
    Heterogen Atoms 16
    Solvent Atoms 86
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XIA2, XDS
    Data Reduction (data scaling) XIA2, SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER