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X-RAY DIFFRACTION
Materials and Methods page
3WFR
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 152.81 α = 90
    b = 154.59 β = 90
    c = 174.67 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Collection Date 2013-04-19
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-1A
    Wavelength List 1.00000
    Site PHOTON FACTORY
    Beamline BL-1A
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.5
    Resolution(Low) 20
    Number Reflections(Observed) 37144
    B(Isotropic) From Wilson Plot 19.43
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.501
    Resolution(Low) 19.975
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 36827
    Number of Reflections(R-Free) 1839
    Percent Reflections(Observed) 70.2
    R-Factor(Observed) 0.2267
    R-Work 0.2244
    R-Free 0.2691
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 128.523
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.501
    Shell Resolution(Low) 3.5952
    Number of Reflections(R-Free) 39
    Number of Reflections(R-Work) 590
    R-Factor(R-Work) 0.3141
    R-Factor(R-Free) 0.3254
    Percent Reflections(Observed) 16.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5952
    Shell Resolution(Low) 3.7003
    Number of Reflections(R-Free) 55
    Number of Reflections(R-Work) 1094
    R-Factor(R-Work) 0.2739
    R-Factor(R-Free) 0.3066
    Percent Reflections(Observed) 29.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7003
    Shell Resolution(Low) 3.819
    Number of Reflections(R-Free) 61
    Number of Reflections(R-Work) 1481
    R-Factor(R-Work) 0.2496
    R-Factor(R-Free) 0.3194
    Percent Reflections(Observed) 39.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.819
    Shell Resolution(Low) 3.9544
    Number of Reflections(R-Free) 91
    Number of Reflections(R-Work) 1803
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.2707
    Percent Reflections(Observed) 47.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9544
    Shell Resolution(Low) 4.1114
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 2126
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.2725
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1114
    Shell Resolution(Low) 4.2968
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2466
    R-Factor(R-Work) 0.224
    R-Factor(R-Free) 0.2702
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2968
    Shell Resolution(Low) 4.5209
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2836
    R-Factor(R-Work) 0.2243
    R-Factor(R-Free) 0.2607
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5209
    Shell Resolution(Low) 4.8004
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3272
    R-Factor(R-Work) 0.2152
    R-Factor(R-Free) 0.2594
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8004
    Shell Resolution(Low) 5.1651
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 3703
    R-Factor(R-Work) 0.2058
    R-Factor(R-Free) 0.2937
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1651
    Shell Resolution(Low) 5.6741
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3826
    R-Factor(R-Work) 0.2215
    R-Factor(R-Free) 0.2707
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6741
    Shell Resolution(Low) 6.4706
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3891
    R-Factor(R-Work) 0.2371
    R-Factor(R-Free) 0.3006
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4706
    Shell Resolution(Low) 8.0621
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3903
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.2534
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.0621
    Shell Resolution(Low) 19.9756
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 3997
    R-Factor(R-Work) 0.2026
    R-Factor(R-Free) 0.216
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.587
    f_plane_restr 0.003
    f_chiral_restr 0.046
    f_angle_d 0.733
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 14291
    Nucleic Acid Atoms 6300
    Heterogen Atoms 156
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1389)
    model building PHASER
    data collection XDS