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X-RAY DIFFRACTION
Materials and Methods page
3WFP
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 126.91 α = 90
    b = 138.36 β = 111.04
    c = 147.62 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Collection Date 2010-01-20
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-17A
    Wavelength List 1.00000
    Site PHOTON FACTORY
    Beamline BL-17A
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 4
    Resolution(Low) 20
    Number Reflections(Observed) 34980
    B(Isotropic) From Wilson Plot 68.62
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 4.005
    Resolution(Low) 19.969
    Cut-off Sigma(F) 2.01
    Number of Reflections(Observed) 34646
    Number of Reflections(R-Free) 1732
    Percent Reflections(Observed) 86.76
    R-Factor(Observed) 0.2604
    R-Work 0.2575
    R-Free 0.3139
     
    Temperature Factor Modeling
    Mean Isotropic B Value 142.666
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0051
    Shell Resolution(Low) 4.1219
    Number of Reflections(R-Free) 19
    Number of Reflections(R-Work) 366
    R-Factor(R-Work) 0.3569
    R-Factor(R-Free) 0.4865
    Percent Reflections(Observed) 12.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1219
    Shell Resolution(Low) 4.2537
    Number of Reflections(R-Free) 63
    Number of Reflections(R-Work) 1198
    R-Factor(R-Work) 0.3175
    R-Factor(R-Free) 0.4213
    Percent Reflections(Observed) 38.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2537
    Shell Resolution(Low) 4.4042
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2880
    R-Factor(R-Work) 0.2969
    R-Factor(R-Free) 0.3126
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4042
    Shell Resolution(Low) 4.5785
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3161
    R-Factor(R-Work) 0.3002
    R-Factor(R-Free) 0.3747
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5785
    Shell Resolution(Low) 4.7841
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3138
    R-Factor(R-Work) 0.2854
    R-Factor(R-Free) 0.3505
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7841
    Shell Resolution(Low) 5.0326
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3153
    R-Factor(R-Work) 0.2493
    R-Factor(R-Free) 0.3744
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0326
    Shell Resolution(Low) 5.3422
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3167
    R-Factor(R-Work) 0.2485
    R-Factor(R-Free) 0.3025
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3422
    Shell Resolution(Low) 5.7455
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 3145
    R-Factor(R-Work) 0.2548
    R-Factor(R-Free) 0.2788
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7455
    Shell Resolution(Low) 6.3071
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3157
    R-Factor(R-Work) 0.261
    R-Factor(R-Free) 0.3316
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3071
    Shell Resolution(Low) 7.1824
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3189
    R-Factor(R-Work) 0.2701
    R-Factor(R-Free) 0.3238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.1824
    Shell Resolution(Low) 8.9131
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3167
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.282
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.9131
    Shell Resolution(Low) 19.9693
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3193
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 11.049
    f_plane_restr 0.003
    f_chiral_restr 0.034
    f_angle_d 0.781
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 27524
    Nucleic Acid Atoms 0
    Heterogen Atoms 40
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building PHASER
    data collection XDS