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X-RAY DIFFRACTION
Materials and Methods page
3WC2
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, sitting drop
    pH 6
    Temperature 293.0
    Details Bis-Tris propan, CaCl2, PEG 3350, pH 6.0, vapor diffusion, sitting drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 96.74 α = 90
    b = 96.74 β = 90
    c = 299.36 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type DECTRIS PILATUS 2M-F
    Collection Date 2012-06-15
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-1A
    Wavelength List 1.1000
    Site PHOTON FACTORY
    Beamline BL-1A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.64
    Resolution(Low) 48.71
    Number Reflections(Observed) 18933
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.107
    B(Isotropic) From Wilson Plot 125.88
     
    High Resolution Shell Details
    Resolution(High) 3.64
    Resolution(Low) 3.86
    Percent Possible(All) 98.1
    R Merge I(Observed) 0.012
    Mean I Over Sigma(Observed) 2.05
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.641
    Resolution(Low) 38.09
    Number of Reflections(Observed) 18926
    Number of Reflections(R-Free) 1333
    Percent Reflections(Observed) 99.67
    R-Factor(Observed) 0.2552
    R-Work 0.2529
    R-Free 0.2875
     
    Temperature Factor Modeling
    Mean Isotropic B Value 104.901
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.641
    Shell Resolution(Low) 3.7714
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 1670
    R-Factor(R-Work) 0.3322
    R-Factor(R-Free) 0.3422
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7714
    Shell Resolution(Low) 3.9223
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1712
    R-Factor(R-Work) 0.3219
    R-Factor(R-Free) 0.3443
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9223
    Shell Resolution(Low) 4.1006
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1732
    R-Factor(R-Work) 0.3091
    R-Factor(R-Free) 0.3292
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1006
    Shell Resolution(Low) 4.3165
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 1736
    R-Factor(R-Work) 0.2942
    R-Factor(R-Free) 0.364
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3165
    Shell Resolution(Low) 4.5865
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1766
    R-Factor(R-Work) 0.2614
    R-Factor(R-Free) 0.2823
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5865
    Shell Resolution(Low) 4.94
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1736
    R-Factor(R-Work) 0.2457
    R-Factor(R-Free) 0.3039
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.94
    Shell Resolution(Low) 5.4358
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 1762
    R-Factor(R-Work) 0.2548
    R-Factor(R-Free) 0.2707
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4358
    Shell Resolution(Low) 6.2195
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1790
    R-Factor(R-Work) 0.2659
    R-Factor(R-Free) 0.334
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2195
    Shell Resolution(Low) 7.8247
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 1768
    R-Factor(R-Work) 0.2658
    R-Factor(R-Free) 0.2552
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.8247
    Shell Resolution(Low) 38.0922
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1921
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2499
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.093
    f_plane_restr 0.003
    f_chiral_restr 0.035
    f_angle_d 0.761
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8128
    Nucleic Acid Atoms 3146
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection UGUI
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale