POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
3WC0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 293.0
    Details Bis-Tris propan, NaNO3, PEG3350, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 87.43 α = 90
    b = 217.56 β = 102.3
    c = 140.91 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX225HE
    Collection Date 2011-07-06
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL41XU
    Wavelength List 1.0000
    Site SPRING-8
    Beamline BL41XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.03
    Resolution(Low) 44.58
    Number Reflections(Observed) 98555
    Percent Possible(Observed) 98.8
     
    High Resolution Shell Details
    Resolution(High) 3.03
    Resolution(Low) 3.03
    Percent Possible(All) 96.5
    R Merge I(Observed) 0.738
    Mean I Over Sigma(Observed) 2.03
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.03
    Resolution(Low) 44.58
    Number of Reflections(Observed) 98545
    Number of Reflections(R-Free) 7040
    Percent Reflections(Observed) 98.86
    R-Factor(Observed) 0.2012
    R-Work 0.1983
    R-Free 0.2393
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.03
    Shell Resolution(Low) 3.0635
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.3324
    R-Factor(R-Free) 0.3688
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0635
    Shell Resolution(Low) 3.0995
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 3060
    R-Factor(R-Work) 0.2968
    R-Factor(R-Free) 0.3279
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0995
    Shell Resolution(Low) 3.1373
    Number of Reflections(R-Free) 242
    Number of Reflections(R-Work) 3065
    R-Factor(R-Work) 0.2876
    R-Factor(R-Free) 0.3308
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1373
    Shell Resolution(Low) 3.177
    Number of Reflections(R-Free) 233
    Number of Reflections(R-Work) 3051
    R-Factor(R-Work) 0.2847
    R-Factor(R-Free) 0.312
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.177
    Shell Resolution(Low) 3.2188
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 3048
    R-Factor(R-Work) 0.2644
    R-Factor(R-Free) 0.3134
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2188
    Shell Resolution(Low) 3.2629
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 3051
    R-Factor(R-Work) 0.2601
    R-Factor(R-Free) 0.342
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2629
    Shell Resolution(Low) 3.3095
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3040
    R-Factor(R-Work) 0.2694
    R-Factor(R-Free) 0.3017
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3095
    Shell Resolution(Low) 3.3589
    Number of Reflections(R-Free) 257
    Number of Reflections(R-Work) 3110
    R-Factor(R-Work) 0.2689
    R-Factor(R-Free) 0.3393
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3589
    Shell Resolution(Low) 3.4113
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 3045
    R-Factor(R-Work) 0.2613
    R-Factor(R-Free) 0.3181
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4113
    Shell Resolution(Low) 3.4672
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 3074
    R-Factor(R-Work) 0.2403
    R-Factor(R-Free) 0.289
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4672
    Shell Resolution(Low) 3.527
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 3061
    R-Factor(R-Work) 0.2346
    R-Factor(R-Free) 0.2907
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.527
    Shell Resolution(Low) 3.5911
    Number of Reflections(R-Free) 238
    Number of Reflections(R-Work) 3039
    R-Factor(R-Work) 0.2296
    R-Factor(R-Free) 0.2849
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5911
    Shell Resolution(Low) 3.6601
    Number of Reflections(R-Free) 256
    Number of Reflections(R-Work) 3057
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.2675
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6601
    Shell Resolution(Low) 3.7348
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 3077
    R-Factor(R-Work) 0.2178
    R-Factor(R-Free) 0.2756
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7348
    Shell Resolution(Low) 3.816
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 3070
    R-Factor(R-Work) 0.2012
    R-Factor(R-Free) 0.2609
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.816
    Shell Resolution(Low) 3.9047
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 3038
    R-Factor(R-Work) 0.2117
    R-Factor(R-Free) 0.2519
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9047
    Shell Resolution(Low) 4.0023
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 3092
    R-Factor(R-Work) 0.2024
    R-Factor(R-Free) 0.2599
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0023
    Shell Resolution(Low) 4.1104
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 3075
    R-Factor(R-Work) 0.2047
    R-Factor(R-Free) 0.243
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1104
    Shell Resolution(Low) 4.2313
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 3042
    R-Factor(R-Work) 0.1916
    R-Factor(R-Free) 0.2332
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2313
    Shell Resolution(Low) 4.3678
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 3089
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3678
    Shell Resolution(Low) 4.5237
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 3070
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.2044
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5237
    Shell Resolution(Low) 4.7046
    Number of Reflections(R-Free) 264
    Number of Reflections(R-Work) 3035
    R-Factor(R-Work) 0.1718
    R-Factor(R-Free) 0.2173
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7046
    Shell Resolution(Low) 4.9185
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 3061
    R-Factor(R-Work) 0.1704
    R-Factor(R-Free) 0.1901
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9185
    Shell Resolution(Low) 5.1775
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 3131
    R-Factor(R-Work) 0.1791
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1775
    Shell Resolution(Low) 5.5013
    Number of Reflections(R-Free) 254
    Number of Reflections(R-Work) 3048
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5013
    Shell Resolution(Low) 5.9252
    Number of Reflections(R-Free) 266
    Number of Reflections(R-Work) 3031
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9252
    Shell Resolution(Low) 6.5198
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 3112
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.2135
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5198
    Shell Resolution(Low) 7.4594
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 3111
    R-Factor(R-Work) 0.1766
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.4594
    Shell Resolution(Low) 9.3836
    Number of Reflections(R-Free) 243
    Number of Reflections(R-Work) 3096
    R-Factor(R-Work) 0.1621
    R-Factor(R-Free) 0.1877
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.3836
    Shell Resolution(Low) 44.5847
    Number of Reflections(R-Free) 249
    Number of Reflections(R-Work) 2984
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.043
    f_dihedral_angle_d 16.921
    f_angle_d 0.999
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 35254
    Nucleic Acid Atoms 0
    Heterogen Atoms 1072
    Solvent Atoms 15
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BSS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building MOLREP
    data collection BSS