X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 293.0
Details Bis-Tris propan, NaNO3, PEG3350, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 87.43 α = 90
b = 217.56 β = 102.3
c = 140.91 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX225HE -- 2011-07-06
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL41XU 1.0000 SPRING-8 BL41XU

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.03 44.58 98.8 -- -- -- -- -- 98555 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.03 3.03 96.5 0.738 -- 2.03 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.03 44.58 -- -- -- 98545 7040 98.86 -- 0.2012 0.1983 0.2393 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.03 3.0635 -- 207 2642 0.3324 0.3688 -- 86.0
X Ray Diffraction 3.0635 3.0995 -- 232 3060 0.2968 0.3279 -- 99.0
X Ray Diffraction 3.0995 3.1373 -- 242 3065 0.2876 0.3308 -- 99.0
X Ray Diffraction 3.1373 3.177 -- 233 3051 0.2847 0.312 -- 99.0
X Ray Diffraction 3.177 3.2188 -- 237 3048 0.2644 0.3134 -- 99.0
X Ray Diffraction 3.2188 3.2629 -- 228 3051 0.2601 0.342 -- 99.0
X Ray Diffraction 3.2629 3.3095 -- 209 3040 0.2694 0.3017 -- 99.0
X Ray Diffraction 3.3095 3.3589 -- 257 3110 0.2689 0.3393 -- 99.0
X Ray Diffraction 3.3589 3.4113 -- 211 3045 0.2613 0.3181 -- 99.0
X Ray Diffraction 3.4113 3.4672 -- 224 3074 0.2403 0.289 -- 99.0
X Ray Diffraction 3.4672 3.527 -- 237 3061 0.2346 0.2907 -- 99.0
X Ray Diffraction 3.527 3.5911 -- 238 3039 0.2296 0.2849 -- 99.0
X Ray Diffraction 3.5911 3.6601 -- 256 3057 0.2256 0.2675 -- 100.0
X Ray Diffraction 3.6601 3.7348 -- 227 3077 0.2178 0.2756 -- 99.0
X Ray Diffraction 3.7348 3.816 -- 235 3070 0.2012 0.2609 -- 99.0
X Ray Diffraction 3.816 3.9047 -- 234 3038 0.2117 0.2519 -- 99.0
X Ray Diffraction 3.9047 4.0023 -- 230 3092 0.2024 0.2599 -- 100.0
X Ray Diffraction 4.0023 4.1104 -- 230 3075 0.2047 0.243 -- 99.0
X Ray Diffraction 4.1104 4.2313 -- 235 3042 0.1916 0.2332 -- 100.0
X Ray Diffraction 4.2313 4.3678 -- 239 3089 0.1757 0.215 -- 99.0
X Ray Diffraction 4.3678 4.5237 -- 226 3070 0.1673 0.2044 -- 99.0
X Ray Diffraction 4.5237 4.7046 -- 264 3035 0.1718 0.2173 -- 100.0
X Ray Diffraction 4.7046 4.9185 -- 232 3061 0.1704 0.1901 -- 100.0
X Ray Diffraction 4.9185 5.1775 -- 219 3131 0.1791 0.2264 -- 100.0
X Ray Diffraction 5.1775 5.5013 -- 254 3048 0.173 0.2149 -- 100.0
X Ray Diffraction 5.5013 5.9252 -- 266 3031 0.189 0.2227 -- 100.0
X Ray Diffraction 5.9252 6.5198 -- 221 3112 0.1739 0.2135 -- 100.0
X Ray Diffraction 6.5198 7.4594 -- 225 3111 0.1766 0.2215 -- 100.0
X Ray Diffraction 7.4594 9.3836 -- 243 3096 0.1621 0.1877 -- 100.0
X Ray Diffraction 9.3836 44.5847 -- 249 2984 0.1738 0.2082 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.043
f_dihedral_angle_d 16.921
f_angle_d 0.999
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 35254
Nucleic Acid Atoms 0
Heterogen Atoms 1072
Solvent Atoms 15

Software

Computing
Computing Package Purpose
BSS Data Collection
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
MOLREP Structure Solution
PHENIX (phenix.refine: 1.8.2_1309) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.2_1309) refinement
MOLREP model building
BSS data collection