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X-RAY DIFFRACTION
Materials and Methods page
3W3D
  •   Crystallization Hide
    Crystallization Experiments
    Method precipitation
    pH 6.6
    Temperature 300.0
    Details 4mM MgCl2, 0.1mM CaCl2, NaN3, PEG 6000, pH 6.6, precipitation , temperature 300K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42 α = 90
    b = 225.3 β = 90
    c = 77.4 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 287
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type Macromolecular data collection system with a Weissenberg camera
    Details The vertically focusing1m long bent mirror of fused silica is 11.5m from the SR source point and 4.6m from the focus point
    Collection Date 1991-02-15
     
    Diffraction Radiation
    Monochromator A bent triangularly and asymmetrically cut Si(111) crystal is used to focus the beam horizontally and produces monochromatic beams
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-6A
    Wavelength List 1.00
    Site PHOTON FACTORY
    Beamline BL-6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.8
    Resolution(Low) 10
    Number Reflections(Observed) 53428
    B(Isotropic) From Wilson Plot 23.05
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MIR
    reflnsShellList 1.8
    Resolution(Low) 10.0
    Number of Reflections(Observed) 53428
    R-Work 0.196
     
    Temperature Factor Modeling
    Mean Isotropic B Value 31.09
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_angle_refined_deg 3.34
    r_bond_refined_d 0.016
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4973
    Nucleic Acid Atoms 0
    Heterogen Atoms 116
    Solvent Atoms 383
     
     
  •   Software and Computing Hide
    Computing
    Data Collection WEIS
    Data Reduction (intensity integration) WEIS
    Data Reduction (data scaling) WEIS
    Structure Solution BOSS
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building BOSS
    data collection WEIS