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X-RAY DIFFRACTION
Materials and Methods page
3W2A
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.5
    Temperature 295.0
    Details 0.1M MgCl2 0.1M Sodium acetate 16% PEG-400, pH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 176.32 α = 90
    b = 39.83 β = 105.79
    c = 73.49 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type PSI PILATUS 6M
    Collection Date 2012-11-03
     
    Diffraction Radiation
    Monochromator Bartels Monochromator Crystal Type Si (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 0.979590
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.78
    Resolution(Low) 48.25
    Number Reflections(All) 23902
    Number Reflections(Observed) 23902
    Percent Possible(Observed) 98.1
    B(Isotropic) From Wilson Plot 65.815
    Redundancy 6.68
     
    High Resolution Shell Details
    Resolution(High) 2.78
    Resolution(Low) 2.94
    Percent Possible(All) 89.2
    Mean I Over Sigma(Observed) 2.31
    R-Sym I(Observed) 0.761
    Redundancy 5.76
    Number Unique Reflections(All) 3942
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.775
    Resolution(Low) 48.246
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 23902
    Number of Reflections(Observed) 23806
    Number of Reflections(R-Free) 1194
    Percent Reflections(Observed) 97.84
    R-Factor(All) 0.2426
    R-Factor(Observed) 0.2426
    R-Work 0.2415
    R-Free 0.2624
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 100.071
    Anisotropic B[1][1] 38.2239
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -9.5862
    Anisotropic B[2][2] -20.5652
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -17.6587
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7755
    Shell Resolution(Low) 2.8866
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2181
    R-Factor(R-Work) 0.4199
    R-Factor(R-Free) 0.4428
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8866
    Shell Resolution(Low) 3.0179
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.3772
    R-Factor(R-Free) 0.3904
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0179
    Shell Resolution(Low) 3.177
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.3026
    R-Factor(R-Free) 0.3715
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.177
    Shell Resolution(Low) 3.376
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.2558
    R-Factor(R-Free) 0.2873
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.376
    Shell Resolution(Low) 3.6366
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2555
    R-Factor(R-Free) 0.278
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6366
    Shell Resolution(Low) 4.0024
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.2173
    R-Factor(R-Free) 0.2621
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0024
    Shell Resolution(Low) 4.5812
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.1921
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5812
    Shell Resolution(Low) 5.7703
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2191
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7703
    Shell Resolution(Low) 48.2536
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.2281
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 26.205
    f_plane_restr 0.003
    f_chiral_restr 0.043
    f_angle_d 0.924
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 912
    Nucleic Acid Atoms 943
    Heterogen Atoms 0
    Solvent Atoms 41
     
     
  •   Software and Computing Hide
    Computing
    Data Collection RemDAq
    Data Reduction (intensity integration) XDS package
    Data Reduction (data scaling) XDS package
    Structure Solution Phaser MR
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser version: MR
    data collection RemDAq