X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 293.0
Details 35% ethylene glycol, 95mM NaNO3, 20mM Tris-HCl, 0.2M NaCl, 10mM MgCl2, 3mM 2-mercaptoethanol, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 148.55 α = 90
b = 355.97 β = 115.41
c = 165.49 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 90
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210 mirrors 2009-03-16
Diffraction Radiation
Monochromator Protocol
Si SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE AR-NW12A 1.00000 PHOTON FACTORY AR-NW12A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
7.5 50 98.2 0.102 0.102 -- 3.6 9956 9777 -- -1.0 250.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
7.5 7.77 97.3 0.712 0.712 2.04 2.9 990

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 7.5 49.94 -- 0.0 9933 9754 475 98.2 -- 0.194 0.194 0.24 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 7.5 7.97 -- 83 1509 0.349 0.398 0.044 97.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 525.5
Anisotropic B[1][1] 185.25
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 68.26
Anisotropic B[2][2] -71.44
Anisotropic B[2][3] 0.0
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 32.38
c_scbond_it 20.94
c_mcangle_it 15.73
c_mcbond_it 9.29
c_improper_angle_d 1.11
c_dihedral_angle_d 21.1
c_angle_deg 1.2
c_bond_d 0.007
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.8
Luzzati Sigma A (Observed) 1.08
Luzzati Resolution Cutoff (Low) 20.0
Luzzati ESD (R-Free Set) 1.12
Luzzati Sigma A (R-Free Set) 1.78
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 17875
Nucleic Acid Atoms 9785
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
ADSC Quantum Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
CNS 1.3 Structure Refinement
Software
Software Name Purpose
CNS version: 1.3 refinement
PHASER model building
ADSC version: Quantum data collection