X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 277.0
Details 18% PEG 3350, 0.15M DL-malic acid, 0.1M HEPES-NaOH, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 277.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 115.58 α = 90
b = 43.82 β = 128.96
c = 77.64 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD Si(111) Double Crystal Monochrometer 2010-11-15
IMAGE PLATE MAR scanner 345 mm plate mirror 2010-07-07
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
MAR MIRRORS SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.2808 APS 23-ID-B
ROTATING ANODE RIGAKU RU200 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 40 94.8 0.125 -- -- 9.8 40028 37958 0.0 2.0 28.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.09 97.1 0.483 -- 2.64 3.5 1976

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIR 2.0 38.76 2.0 0.0 40082 37958 3669 94.7 0.201 0.197 0.197 0.235 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.09 3800 373 4781 0.283 0.286 0.015 75.4
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 31.3
Anisotropic B[1][1] -1.1
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 2.8
Anisotropic B[2][2] 4.12
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -3.03
RMS Deviations
Key Refinement Restraint Deviation
c_improper_angle_d 0.69
c_dihedral_angle_d 22.1
c_angle_deg 1.1
c_bond_d 0.005
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.22
Luzzati Sigma A (Observed) 0.21
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.27
Luzzati Sigma A (R-Free Set) 0.22
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2001
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 169

Software

Computing
Computing Package Purpose
DENZO Data Collection
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SOLVE Structure Solution
CNS 1.3 Structure Refinement
Software
Software Name Purpose
CNS version: 1.3 refinement
SOLVE model building
DENZO data collection