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X-RAY DIFFRACTION
Materials and Methods page
3VZH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 293.0
    Details 20% PEG3350, 0.2M sodium bromide, 0.1M Bis-Tris propane, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 123.32 α = 90
    b = 43.78 β = 90.75
    c = 37.01 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2012-05-14
     
    Diffraction Radiation
    Monochromator DCM Si (111) Crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PAL/PLS BEAMLINE 6B
    Wavelength List 0.9795
    Site PAL/PLS
    Beamline 6B
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.7
    Resolution(Low) 50
    Number Reflections(Observed) 20990
    Percent Possible(Observed) 96.5
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.76
    Percent Possible(All) 95.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 50.0
    Number of Reflections(Observed) 19912
    Number of Reflections(R-Free) 1076
    Percent Reflections(Observed) 96.24
    R-Factor(Observed) 0.18522
    R-Work 0.18302
    R-Free 0.22613
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 32.212
    Anisotropic B[1][1] -2.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.06
    Anisotropic B[2][2] 3.39
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.39
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.747
    Number of Reflections(R-Free) 88
    Number of Reflections(R-Work) 1349
    R-Factor(R-Work) 0.261
    R-Factor(R-Free) 0.279
    Percent Reflections(Observed) 92.53
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.012
    r_chiral_restr 0.155
    r_dihedral_angle_4_deg 13.435
    r_dihedral_angle_3_deg 14.665
    r_dihedral_angle_2_deg 31.045
    r_dihedral_angle_1_deg 7.324
    r_angle_refined_deg 1.942
    r_bond_refined_d 0.021
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1576
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 154
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building PHASER
    data collection HKL-2000