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X-RAY DIFFRACTION
Materials and Methods page
3VXX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.4
    Temperature 293.0
    Details 7% PEG 10000, 0.1M sodium acetate, 0.2M sodium chloride, pH 4.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 89.18 α = 90
    b = 93.83 β = 90
    c = 55.36 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2009-11-25
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 1.0
    Site PHOTON FACTORY
    Beamline AR-NW12A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 12096
    Number Reflections(Observed) 12048
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.078
    B(Isotropic) From Wilson Plot 41.31
    Redundancy 7.2
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.28
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.477
    Mean I Over Sigma(Observed) 4.5
    Redundancy 7.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.204
    Resolution(Low) 28.339
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 12027
    Number of Reflections(R-Free) 574
    Percent Reflections(Observed) 99.54
    R-Factor(Observed) 0.1965
    R-Work 0.1955
    R-Free 0.2145
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -13.1184
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 11.4286
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.6898
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.204
    Shell Resolution(Low) 2.4257
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2830
    R-Factor(R-Work) 0.2721
    R-Factor(R-Free) 0.3409
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4257
    Shell Resolution(Low) 2.7764
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2828
    R-Factor(R-Work) 0.2601
    R-Factor(R-Free) 0.3333
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7764
    Shell Resolution(Low) 3.497
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2858
    R-Factor(R-Work) 0.1913
    R-Factor(R-Free) 0.2073
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.497
    Shell Resolution(Low) 28.3414
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2937
    R-Factor(R-Work) 0.1684
    R-Factor(R-Free) 0.1738
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.062
    f_dihedral_angle_d 23.213
    f_angle_d 1.193
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 511
    Nucleic Acid Atoms 570
    Heterogen Atoms 36
    Solvent Atoms 123
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Molrep
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building Molrep
    data collection HKL-2000