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X-RAY DIFFRACTION
Materials and Methods page
3VX7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 9.5
    Temperature 293.0
    Details 0.8M sodium phosphate, 0.7M potassium phosphate, 0.2M lithium sulfate, 0.1M CHES, pH 9.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 185.93 α = 90
    b = 185.93 β = 90
    c = 185.93 γ = 90
     
    Space Group
    Space Group Name:    P 41 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Collection Date 2010-10-08
     
    Diffraction Radiation
    Monochromator Numerical link type Si(111) double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-5A
    Wavelength List 1.0000
    Site PHOTON FACTORY
    Beamline BL-5A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.2
    Resolution(Low) 49.69
    Number Reflections(All) 18726
    Number Reflections(Observed) 18382
    Percent Possible(Observed) 98.2
    Redundancy 9.5
     
    High Resolution Shell Details
    Resolution(High) 3.2
    Resolution(Low) 3.31
    Percent Possible(All) 99.9
    Mean I Over Sigma(Observed) 9.1
    R-Sym I(Observed) 0.386
    Redundancy 9.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.2
    Resolution(Low) 49.69
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 18710
    Number of Reflections(Observed) 16465
    Number of Reflections(R-Free) 1641
    Percent Reflections(Observed) 88.0
    R-Factor(All) 0.253
    R-Factor(Observed) 0.249
    R-Work 0.249
    R-Free 0.288
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 91.7
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2
    Shell Resolution(Low) 3.4
    Number of Reflections(Observed) 2496
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 2245
    R-Factor(R-Work) 0.331
    R-Factor(R-Free) 0.359
    R-Free Error 0.023
    Percent Reflections(Observed) 82.4
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.73
    c_scbond_it 1.63
    c_mcangle_it 2.42
    c_mcbond_it 1.35
    c_improper_angle_d 0.93
    c_bond_d 0.01
    c_angle_deg 1.6
    c_dihedral_angle_d 25.3
     
    Coordinate Error
    Luzzati ESD(Observed) 0.44
    Luzzati Sigma A(Observed) 0.6
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.52
    Luzzati Sigma A(R-Free Set) 0.7
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3314
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement CNS 1.3
     
    Software
    refinement CNS version: 1.3
    model building MOLREP
    data collection HKL-2000