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X-RAY DIFFRACTION
Materials and Methods page
3VX6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.6
    Temperature 293.0
    Details 2.0M ammonium sulfate, 0.2M potassium/sodium tartrate, 0.1M citrate, pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 118.91 α = 90
    b = 118.91 β = 90
    c = 45.05 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX225HE
    Collection Date 2011-01-24
     
    Diffraction Radiation
    Monochromator Rotated-inclined double-crystal monochromator , Si (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL41XU
    Wavelength List 1.0000
    Site SPRING-8
    Beamline BL41XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 38.92
    Number Reflections(All) 12559
    Number Reflections(Observed) 12144
    Percent Possible(Observed) 96.7
    B(Isotropic) From Wilson Plot 62.1
    Redundancy 20.0
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.69
    Percent Possible(All) 67.0
    Mean I Over Sigma(Observed) 8.6
    R-Sym I(Observed) 0.3
    Redundancy 19.6
    Number Unique Reflections(All) 1251
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 38.92
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 11354
    Number of Reflections(R-Free) 1168
    Percent Reflections(Observed) 98.8
    R-Factor(All) 0.228
    R-Factor(Observed) 0.224
    R-Work 0.224
    R-Free 0.268
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 49.7
    Anisotropic B[1][1] 4.98
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 4.98
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -9.97
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.76
    Number of Reflections(Observed) 1793
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 1600
    R-Factor(R-Work) 0.303
    R-Factor(R-Free) 0.347
    R-Free Error 0.025
    Percent Reflections(Observed) 94.4
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.72
    c_scbond_it 1.77
    c_mcangle_it 2.17
    c_mcbond_it 1.27
    c_improper_angle_d 0.86
    c_bond_d 0.009
    c_angle_deg 1.5
    c_dihedral_angle_d 24.7
     
    Coordinate Error
    Luzzati ESD(Observed) 0.34
    Luzzati Sigma A(Observed) 0.39
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.44
    Luzzati Sigma A(R-Free Set) 0.52
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2113
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 17
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement CNS 1.3
     
    Software
    refinement CNS version: 1.3
    model building MOLREP
    data collection HKL-2000