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X-RAY DIFFRACTION
Materials and Methods page
3VW7
  •   Crystallization Hide
    Crystallization Experiments
    Temperature 293.0
    Details 0.1-0.2M sodium chloride, 100mM sodium phosphate pH 6.0-6.5, 25%-35% PEG 300, Lipidic cubic phase (in meso phase), temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 44.04 α = 90
    b = 71.46 β = 90
    c = 172.19 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2012-02-18
     
    Diffraction Radiation
    Monochromator Double crystal cryo-cooled Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.033
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.2
    Resolution(Low) 30
    Number Reflections(All) 28455
    Number Reflections(Observed) 27181
    Percent Possible(Observed) 95.6
    R Merge I(Observed) 0.135
    Redundancy 4.8
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.25
    Percent Possible(All) 85.7
    R Merge I(Observed) 0.575
    Redundancy 3.3
    Number Unique Reflections(All) 1585
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 28.273
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 28455
    Number of Reflections(Observed) 25921
    Number of Reflections(R-Free) 1306
    Percent Reflections(Observed) 91.01
    R-Factor(All) 0.2188
    R-Factor(Observed) 0.2188
    R-Work 0.218
    R-Free 0.235
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 46.5549
    Anisotropic B[1][1] 25.201
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -8.8018
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -16.3993
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1994
    Shell Resolution(Low) 2.2874
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2190
    R-Factor(R-Work) 0.3184
    R-Factor(R-Free) 0.3808
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2874
    Shell Resolution(Low) 2.3915
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2533
    R-Factor(R-Work) 0.2846
    R-Factor(R-Free) 0.3101
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3915
    Shell Resolution(Low) 2.5175
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.2508
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5175
    Shell Resolution(Low) 2.6751
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.2307
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6751
    Shell Resolution(Low) 2.8814
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2455
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8814
    Shell Resolution(Low) 3.1711
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2850
    R-Factor(R-Work) 0.2233
    R-Factor(R-Free) 0.2713
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1711
    Shell Resolution(Low) 3.6291
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2922
    R-Factor(R-Work) 0.2116
    R-Factor(R-Free) 0.2553
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6291
    Shell Resolution(Low) 4.5692
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2894
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2074
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5692
    Shell Resolution(Low) 28.2755
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3117
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.1828
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.965
    f_plane_restr 0.006
    f_chiral_restr 0.06
    f_angle_d 0.948
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3470
    Nucleic Acid Atoms 0
    Heterogen Atoms 263
    Solvent Atoms 91
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Locally modified Blu-Ice GUI interface to EPICS control
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL
    Structure Solution Phenix (phaser)
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL